Dr. Marion Grould
at POLLEN Metrology
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 10 April 2024 Presentation + Paper
Proceedings Volume 12954, 1295412 (2024) https://doi.org/10.1117/12.3010460
KEYWORDS: Data modeling, Education and training, Performance modeling, Modeling, Mathematical optimization, Quantum experiments, Data processing, Process engineering, Process modeling, Quantum processes

Proceedings Article | 27 April 2023 Poster + Paper
Proceedings Volume 12496, 124962P (2023) https://doi.org/10.1117/12.2657908
KEYWORDS: Edge detection, Metrology, Scanning electron microscopy, Data modeling, Transmission electron microscopy, Deep learning, Semiconductors, Critical dimension metrology

Proceedings Article | 22 February 2021 Presentation + Paper
Proceedings Volume 11615, 116150K (2021) https://doi.org/10.1117/12.2583810
KEYWORDS: Machine learning, Semiconductors, Microscopes, Metrology, Process engineering, Manufacturing, Image processing, Databases, Algorithm development, Transmission electron microscopy

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top