Marla Dowell is the Director of CHIPS Metrology Program and the National Institute of Standards and Technology (NIST) Boulder Laboratory. Dr. Dowell is leading an effort to expand and advance NIST's measurement science foundation for the semiconductor industry. Most recently, she served as the director of the NIST Communications Technology Laboratory, the leading national laboratory for advanced communications standards and measurements. Marla began her NIST career as a researcher in the field of optical metrology for photolithography. She has been recognized for her work fostering collaborations and leading high-performance research organizations with numerous awards, including the Presidential Rank Award of Distinguished Executive, NIST’s Allen V. Astin Award, and the Arthur S. Flemming Award from George Washington University.