Dr. Matthieu Visser
Sr. Research Scientist at Philips Research Labs
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 12 April 2005 Paper
H. Visser, N. Fisekovic, R. Nalliah, X. Wei, H. Venema, G. den Heeten
Proceedings Volume 5744, (2005) https://doi.org/10.1117/12.595092
KEYWORDS: LCDs, X-rays, X-ray imaging, Radiology, CRTs, Mammography, Reflection, Lamps, Eye, Calibration

Proceedings Article | 8 November 2000 Paper
Raluca Constantinescu, Jeroen Jonkers, Petra Hegeman, Matthieu Visser
Proceedings Volume 4146, (2000) https://doi.org/10.1117/12.406661
KEYWORDS: Plasma, Extreme ultraviolet, Mirrors, EUV optics, Lithography, Contamination, Pulsed laser operation, Extreme ultraviolet lithography, CCD cameras, Spectroscopy

Proceedings Article | 21 July 2000 Paper
Matthieu Visser, Raluca Constantinescu, Petra Hegeman, Jeroen Jonkers, Martijn Dekker, Eric Louis, Dirk Hambach
Proceedings Volume 3997, (2000) https://doi.org/10.1117/12.390112
KEYWORDS: Extreme ultraviolet, Mirrors, Interferometers, Plasma, EUV optics, Interferometry, Visible radiation, Diffraction gratings, Shearing interferometers, Laser optics

Proceedings Article | 25 June 1999 Paper
Matthieu Visser, Martijn Dekker, Petra Hegeman, Joseph Braat
Proceedings Volume 3676, (1999) https://doi.org/10.1117/12.351096
KEYWORDS: Mirrors, Interferometers, Wavefronts, Extreme ultraviolet, Interferometry, Plasma, Spherical lenses, EUV optics, Charge-coupled devices, Error analysis

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