Dr. Mauro Prasciolu
at Deutsches Elektronen-Synchrotron
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 8 July 2021 Open Access Paper
Mauro Prasciolu, Kevin Murray, Nikolay Ivanov, Holger Fleckenstein, Martin Domaracký, Luca Gelisio, Fabian Trost, Kartik Ayyer, Dietrich Krebs, Steve Aplin, Salah Awel, Ulrike Boesenberg, Grega Belšak, Anton Barty, Armando Estillore, Matthias Fuchs, Yaroslav Gevorkov, Joerg Hallmann, Chan Kim, Juraj Knoška, Jochen Küpper, Chufeng Li, Wei Lu, Valerio Mariani, Andrew Morgan, Johannes Möller, Anders Madsen, Dominik Oberthür, Gisel Peña Murillo, David Reis, Markus Scholz, Božidar Šarler, Pablo Villanueva-Perez, Oleksandr Yefanov, Kara Zielinski, Alexey Zozulya, Henry Chapman, Saša Bajt
Proceedings Volume 11886, 118860M (2021) https://doi.org/10.1117/12.2592229

Proceedings Article | 12 May 2015 Paper
Proceedings Volume 9510, 95100S (2015) https://doi.org/10.1117/12.2178246
KEYWORDS: Multilayers, Silicon, Diffraction gratings, Polishing, Coating, Silica, X-rays, Etching, Surface roughness, Wet etching

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