Mr. Mike Wilson Profile

Mike Wilson

SPIE Involvement:

Author

Publications (10)

Proceedings Article | 26 August 2008 Paper

Microbolometer sensor model for performance predictions and real-time image generation of infrared scenes and targets

Robert Richwine, Yash Puri, Ashok Sood, Raymond Balcerak, Stuart Horn, Glenn Baker, Michael Wilson

Proceedings Volume 7055, 70550T (2008) https://doi.org/10.1117/12.801337

KEYWORDS: 3D modeling, Sensors, Minimum resolvable temperature difference, Bolometers, Performance modeling, Atmospheric modeling, Modulation transfer functions, Image sensors, Signal to noise ratio, Thermal modeling

Read Abstract +

Presented is a comprehensive, physics-based model for microbolometer detector and sensor performance prediction. The model combines equations found in the literature and various standard models that generate NETD, MRTD, 3-D noise statistics and atmosphere characteristics (MODTRAN-based), with a comprehensive microbolometer model and HgCdTe model developed by the author to provide an end-to-end detector/FPA/sensor analysis and design tool, as well as a realistic image sequence generation tool. The model characterizes the individual pixel element based on the structure used, the various layer thicknesses, the electrical and thermal characteristics of the bolometer material and the biasing and readout circuit, and uses these results to calculate response and noise, NEP and NETD. The NETD, MTF and MRTD are predicted from the optics, detector and readout. Predicted NETD has been compared and verified with values found in literature, results from other models, and to uncooled camera measurements. The MRTD prediction has been verified with camera measurements and with standard industry MRTD model outputs. The model also calculates atmospheric path radiance and transmittance for horizontal paths based on MODTRAN outputs for the LWIR band at altitudes from 0 to 10km and ranges from 1 to 50km for assessments of air-to-air engagement SNR's. The model in matlab utililizes a 3-D noise model to provide accurate realistic imagery used to present realistic sensor images and to further validate the NETD and MRTD routines.(1) Images at 30Hz and 60Hz have been generated for visual assessment by the user and have mirrored industry model results and real-time camera images for MRTD's for the temporal noise case. The model's 3-D noise generation feature allows the prediction of MRTD vs. frequency under any 3-D noise combination. This model provides an end-to-end performance prediction tool useful in bolometer element design, readout design and for system level trade studies.

Proceedings Article | 7 May 2007 Paper

Development and results of NIR polarization camera

Glenn Baker, Mike Wilson, Phil Coulter

Proceedings Volume 6567, 65671L (2007) https://doi.org/10.1117/12.720746

KEYWORDS: Cameras, Staring arrays, Polarization, Polarimetry, Polarizers, Indium gallium arsenide, Near infrared, Light scattering, Bidirectional reflectance transmission function, Wave plates

Read Abstract +

Proceedings Article | 2 May 2007 Paper

Spectral characterization of diffractively structured GaAs using the ARISTMS

Phil Coulter, Michael Wilson

Proceedings Volume 6545, 654505 (2007) https://doi.org/10.1117/12.720419

KEYWORDS: Gallium arsenide, Transmittance, Reflectivity, Photoresist materials, Photomasks, Scatter measurement, Data modeling, Etching, Sensors, Spectroscopy

Read Abstract +

Proceedings Article | 18 April 2006 Paper

ARISTMS: a new automated data acquisition capability to spectrally characterize samples and materials

Michael Wilson, Phil Coulter, Paul Beer

Proceedings Volume 6205, 62050I (2006) https://doi.org/10.1117/12.665653

KEYWORDS: Reflectivity, Transmittance, Spectroscopy, Data acquisition, Mirrors, Sensors, Integrating spheres, Gold, Beam expanders, Near infrared

Read Abstract +

Proceedings Article | 18 May 2005 Paper

Diffractively structured GaAs EOIR windows

Michael Wilson, Phillip Coulter, Jay Hammer, Gregg Borek

Proceedings Volume 5786, (2005) https://doi.org/10.1117/12.607454

KEYWORDS: Etching, Gallium arsenide, Semiconducting wafers, Photoresist materials, Atomic force microscopy, Reflectivity, Transmittance, Antireflective coatings, Thin film coatings, Photoresist developing

Read Abstract +

Proceedings Article | 26 September 2003 Paper

Diffractively structured multispectral GaAs EO-seeker windows for kill vehicles

Michael Wilson, Randy Crouse, Peter Ehrbach, Phil Reiner

Proceedings Volume 5078, (2003) https://doi.org/10.1117/12.487148

KEYWORDS: Gallium arsenide, Reflectivity, Etching, Silicon, Photoresist materials, Infrared materials, Semiconducting wafers, Antireflective coatings, Coating, Electron beams

Read Abstract +

Proceedings Article | 28 September 1994 Paper

Correlation of 0.67um scatter with local stress in Ge impacted with the modified Cambridge liquid jet device

Michael Wilson, D. Price, Steve Strohecker

Proceedings Volume 2286, (1994) https://doi.org/10.1117/12.187334

KEYWORDS: Bidirectional reflectance transmission function, Germanium, Failure analysis, Liquids, Scatter measurement, Statistical analysis, Sensors, Image analysis, Raster graphics, Solids

Read Abstract +

Proceedings Article | 28 September 1994 Paper

Impact damage as a function of crystal orientation in Ge IR windows employing durable phosphide coatings

Michael Wilson, Marshal Thomas, Ignacio Perez, D. Price

Proceedings Volume 2286, (1994) https://doi.org/10.1117/12.187333

KEYWORDS: Germanium, Crystals, Transmittance, Resistance, Optical coatings, X-ray diffraction, Thin film coatings, Liquids, Carbon, Single crystal X-ray diffraction

Read Abstract +