Methods for determining the angular orientation of objects using interferometric measurements of different-frequency signals reflected by corner reflectors of satellite systems are considered. Determining the angular orientation of objects is one of the most common ways to expand the functionality of the consumer equipment of satellite radio navigation systems. The proposed method provides the determination of the angular orientation of a distant object based on the results of the analysis of the frequency spectrum of the reflected signal. The method is implemented using corner reflectors consisting of mutually orthogonal plane-parallel plates of different optical thicknesses. Each face (plane-parallel plate) of the corner reflector forms a unique frequency spectrum of the reflected signal. The desired value of the angular orientation is determined based on the analysis of the frequency spectrum of the recorded reflected signal and the criterion of maximum similarity of the spectrum of a certain orientation of the corner reflector faces. With normal incidence of the probing beam on a plane-parallel plate of a corner reflector, only one frequency is present in the spectrum of the recorded signal. The appearance of only one frequency, determined by the optical thickness of the reflecting plate, serves as a criterion for the orthogonal orientation of the corner reflector and the distant object, respectively.
The paper proposes a method of radio frequency conversion of optical spectrum using an electro-optical modulator of moving mirror Fourier spectrometer, which allows to obtain high resolution with small movement of moving mirror Fourier spectrometer. The results of experimental measurements are presented.
The possibility of simultaneous measurement of the refractive index and the thickness of optically transparent films in a classical interferometer with a modified illuminator is shown. The illuminator includes a source of coherent and incoherent lighting. Analysis of the correlation and interference fringes makes it possible to simultaneously determine the parameters of the refractive index and thickness for the considered region of the film. The method eliminates errors associated with the need to use different methods for measuring parameters.
In most cases, the definition of artificial intelligence implies the ability of a machine to imitate human behavior. In the development of artificial intelligence, an important element is algorithms. It is the algorithms that make the system smart. Currently the questions being raised about the way society is structured with regard to data use and data privacy, data sharing. Effective methods of developing functional artificial intelligence is to based on the architecture of the brain. The ubiquity of the internet and smartphone prevalence around the world means that within the next decade or two, nearly every person on earth will have access to artificial intelligence. The paper discusses the correlation identification algorithm in artificial intelligence systems. The paper describes the structure of the algorithm for mutual identification of intelligent systems. The algorithm is based on the advantages of the SmtLoq technology. The problems of the formation of separate subsystems in a common set of integrated intellectual systems are considered.
KEYWORDS: Transmitters, Computer programming, Receivers, Manufacturing, Telecommunications, Information security, Control systems, Error control coding, Computer security, Algorithm development
Systems of remote control with unidirectional communication channel, made using KeeLoq technology, have found wide application in such modern devices as car security systems, identification systems, systems for restricting access to premises, electronic locks, process control, etc. The paper describes a comparative analysis of KeeLoq technologies [1] and SmtLoq. The SmtLoq algorithm uses a set of random numbers in each transmission, and does not use serial numbers, factory and secret keys, counters. In SmtLoq technology, information about the transferred command is determined from the correlation analysis of the transmitted sequence of random numbers. The peculiarity of the new SmtLoq technology is protection from interception in a row even of several successive control commands. The minimum size of the control packet in the SmtLoq algorithm is four bytes of random numbers and one byte of the checksum. The maximum probability of guessing the next command decreases with the increase in the number of random data in the control command packet. The probability of repetition of a set of random data in the transmitted packet is extremely small, thus, the single use of a certain set of random data in a packet ensures the uselessness of known computer methods of code selection. The lack of the use of keys and serial numbers provides an opportunity for each user to create a unique codec-decoder pair from arbitrary eight-bit chips with appropriate firmware for the encoder and decoder.
It's investigated the formation principles of the mirrored polarized radiation by rough surface on the model basis of
statistically oriented micro flats with distinctive distribution of their altitudes and slope angles. Mirror component is
formed as the result of waves' interference that are reflected from the statistically oriented micro flats, which normals
assign solid angle and responds to the first diffracting speck. We'll receive normalized Mueller matrix of mirror
reflection for the isotropic rough surface, integrating Jones vector of the average statistical micro flat within the limits
of the first diffracting speck. It is typical that there is no beam depolarization for the mirror component.
Complying with certain conditions we'll receive the situation when the reflected beam intensity of p-polarization for
rough surface predominates the corresponding value for the polished one in pan angles. This effect is especially
visualized in the field of the working hade. It can be explained on the ground of two phenomena: change of the
effective refraction coefficient of the reflecting surface due to the microscopic defects and interference from the
statistically oriented micro flats of the distinctive size, that is larger than wave length. At the same time intensity of scomponent
in the reflected beam from rough surface is always lower than correspondent value for the polished one.
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