Prof. Nobukazu Teranishi
Program Management at Univ of Hyogo
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 20 February 2017 Paper
Proceedings Volume 10108, 101080N (2017) https://doi.org/10.1117/12.2251788
KEYWORDS: Signal detection, Modulators, Real time imaging, Imaging devices, Fluorescence lifetime imaging, CMOS sensors, Microscopy, Life sciences, Luminescence, Computer aided design, Imaging systems, Image processing

Proceedings Article | 27 April 1999 Paper
Ichiro Murakami, Takashi Nakano, Keisuke Hatano, Yasutaka Nakashiba, Masayuki Furumiya, Tsuyoshi Nagata, Hiroaki Utsumi, Satoshi Uchiya, Kouichi Arai, Nobuhiko Mutoh, Akiyoshi Kohno, Nobukazu Teranishi, Yasuaki Hokari
Proceedings Volume 3649, (1999) https://doi.org/10.1117/12.347077
KEYWORDS: Camera shutters, Silicon, CCD image sensors, Reflectivity, Photodiodes, Refractive index, Charge-coupled devices, Image sensors, Cameras

Proceedings Article | 13 August 1997 Paper
Akio Tanaka, Shouhei Matsumoto, Nanao Tsukamoto, Shigeyuki Itoh, Kazuhiro Chiba, Tsutomu Endoh, Akihiro Nakazato, Kuniyuki Okuyama, Yuuichi Kumazawa, Minoru Hijikawa, Hideki Gotoh, Takanori Tanaka, Nobukazu Teranishi
Proceedings Volume 3061, (1997) https://doi.org/10.1117/12.280339
KEYWORDS: Bolometers, Titanium, Resistance, Field effect transistors, Temperature metrology, Cameras, Sensors, Infrared bolometers, Staring arrays, Silicon

Proceedings Article | 25 April 1997 Paper
Shin'ichi Kawai, Keisuke Hatano, Shinobu Suwazono, Fumihiro Futamura, Daisuke Shohji, Satoshi Katoh, Yasutaka Nakashiba, Michihiro Morimoto, Eiji Takeuchi, Kouichi Arai, Toshihiro Kawamura, Yukio Taniji, Kozo Orihara, Nobukazu Teranishi, Yasuaki Hokari
Proceedings Volume 3019, (1997) https://doi.org/10.1117/12.275173
KEYWORDS: Electrodes, Photodiodes, Image sensors, Amplifiers, Image resolution, Surgery, Clocks, Charge-coupled devices, CCD image sensors, Image processing

Proceedings Article | 30 May 1995 Paper
Hiromi Azuma, Tsutomu Endoh, Kazuo Konuma, Yoshitaka Asano, Takanori Tanaka, Nobukazu Teranishi
Proceedings Volume 2474, (1995) https://doi.org/10.1117/12.210546
KEYWORDS: CCD image sensors, Temperature metrology, Infrared radiation, Sensors, Infrared imaging, Imaging systems, Thermography, Infrared sensors, Testing and analysis, Image sensors

Showing 5 of 9 publications
Conference Committee Involvement (13)
Image Sensors and Imaging Systems 2015
9 February 2015 | San Francisco, California, United States
Image Sensors and Imaging Systems 2014
5 February 2014 | San Francisco, California, United States
Sensors, Cameras, and Systems for Industrial/Scientific Applications XIV
6 February 2013 | Burlingame, California, United States
Sensors, Cameras, and Systems for Industrial/Scientific Applications XIII
25 January 2012 | Burlingame, California, United States
Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications XII
25 January 2011 | San Francisco Airport, California, United States
Showing 5 of 13 Conference Committees
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