Mr. Raúl Andres Castañeda Quintero Profile

Raúl Andres Castañeda Quintero

at Univ EAFIT

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Author

Publications (5)

Proceedings Article | 13 March 2024 Presentation + Paper

Diatom classification via deep learning using raw holograms captured by a lenless holographic system

B. Bogue-Jimenez, R. Castañeda, C. Trujillo, A. Doblas

Proceedings Volume 12903, 129030H (2024) https://doi.org/10.1117/12.3001568

KEYWORDS: Education and training, Data modeling, Holography, Holograms, Image restoration, Digital holography, Deep learning, Computer simulations, Microscopy, Environmental monitoring

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SPIE Journal Paper | 31 July 2020

Single-shot pseudostochastic speckle noise reduction in numerical complex-valued wavefields

Carlos Andrés Buitrago-Duque, Raúl Andres Castañeda Quintero, Jorge Ivan Garcia-Sucerquia

OE, Vol. 59, Issue 07, 073107, (July 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.7.073107

KEYWORDS: Speckle, Denoising, Reflectivity, Superposition, Digital holography, Coherence imaging, Optical engineering, Signal to noise ratio, Microscopes

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Proceedings Article | 27 April 2020 Paper

Reduction in data acquisition for resolution improvement in structured illumination digital holographic microscopy

R. Castaneda, T. O'Connor, Ana Doblas, B. Javidi

Proceedings Volume 11402, 114020R (2020) https://doi.org/10.1117/12.2555091

KEYWORDS: Digital holography, Imaging systems, Holograms, Fourier transforms, Stars, Data acquisition, Holography, Microscopy, Spatial frequencies, Image resolution

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Proceedings Article | 15 May 2018 Presentation

3D topography of reflective samples by single-shot digital holographic microscopy (Conference Presentation)

Jorge Garcia-Sucerquia, Raul Castañeda

Proceedings Volume 10666, 106660V (2018) https://doi.org/10.1117/12.2306863

KEYWORDS: Digital holography, Holography, Reflectivity, Microscopy, Microscopes, Diffraction

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Proceedings Article | 22 August 2017 Paper

Evaluating polarization diversity for speckle reduction in retinal image quality estimates

Jorge Herrera-Ramirez, Diego Hincapie-Zuluaga, Nelson Correa, Raul Castañeda-Quintero, Jefry Gaviria, Mikel Aldana

Proceedings Volume 10453, 104532L (2017) https://doi.org/10.1117/12.2276298

KEYWORDS: Speckle, Polarization, Metrology, Retinal scanning, Imaging systems, Light sources, Semiconductor lasers, Superluminescent diodes, Laser beam diagnostics, Cameras

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