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Remy Neviere
at Thales SESO SAS
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 26 August 2020 Paper
Reflective optics for EUV/x-ray sources at Thales SESO: possibilities and perspectives
Proceedings Volume 11492, 114920H (2020) https://doi.org/10.1117/12.2570604
KEYWORDS: Reflectivity, Imaging systems, Imaging spectroscopy, Metrology, Mirrors, Extreme ultraviolet, Hard x-rays, X-ray optics, X-ray technology, Optical design
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