Robert Groulx
at Teledyne DALSA Semiconductor
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 23 July 2014 Paper
S. Holland, C. Bebek, F. Dion, R. Frost, R. Groulx, J. Lee, G. Wang
Proceedings Volume 9154, 91541E (2014) https://doi.org/10.1117/12.2057219
KEYWORDS: Charge-coupled devices, Transistors, Amplifiers, Optical amplifiers, Capacitance, Field effect transistors, Silica, CCD cameras, Diffusion, Electrodes

Proceedings Article | 25 September 2012 Paper
C. Bebek, R. Coles, P. Denes, F. Dion, J. Emes, R. Frost, D. Groom, R. Groulx, S. Haque, S. Holland, A. Karcher, W. Kolbe, J. Lee, N. Palaio, N. Roe, C. Tran, G. Wang
Proceedings Volume 8453, 845305 (2012) https://doi.org/10.1117/12.926606
KEYWORDS: Charge-coupled devices, Semiconducting wafers, Amplifiers, CCD cameras, Silicon, Quantum efficiency, Absorption, Silica, Plasma enhanced chemical vapor deposition, Cameras

Proceedings Article | 15 February 2012 Paper
S. Haque, F. Dion, R. Frost, R. Groulx, S. Holland, A. Karcher, W. Kolbe, N. Roe, G. Wang, Y. Yu
Proceedings Volume 8298, 82980X (2012) https://doi.org/10.1117/12.905460
KEYWORDS: Transistors, Amplifiers, Charge-coupled devices, Capacitance, Diffusion, Silicon, Field effect transistors, Interference (communication), Resistors, Electrodes

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