Dr. Robert C. Stirbl
Program Manager at Jet Propulsion Lab
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 12 January 2004 Paper
Bedabrata Pain, Bruce Hancock, Thomas Cunningham, Suresh Seshadri, Chao Sun, Pavani Pedadda, Christopher Wrigley, Robert Stirbl
Proceedings Volume 5167, (2004) https://doi.org/10.1117/12.512278
KEYWORDS: Imaging systems, Field effect transistors, Oxides, Image processing, Digital electronics, Silicon, Diodes, Ionizing radiation, Photodiodes, Radiation effects

Proceedings Article | 28 January 2002 Paper
Robert Stirbl, Bedabrata Pain, Thomas Cunningham, Bruce Hancock, Guang Yang, Julie Heynssens, Christopher Wrigley
Proceedings Volume 4547, (2002) https://doi.org/10.1117/12.454382
KEYWORDS: Imaging systems, Stars, Sensors, Charge-coupled devices, Active sensors, Image sensors, CMOS sensors, Photodiodes, Optical tracking, Image processing

Proceedings Article | 12 December 2001 Paper
Robert Stirbl, Bedabrata Pain, Thomas Cunningham, Bruce Hancock, Chao Sun, Guang Yang, Julie Heynssens, Christopher Wrigley
Proceedings Volume 4540, (2001) https://doi.org/10.1117/12.450670
KEYWORDS: Imaging systems, Sensors, Stars, Cameras, Analog electronics, Sun, Active sensors, Remote sensing, Optical tracking, Image sensors

Proceedings Article | 15 May 2001 Paper
Bruce Hancock, Robert Stirbl, Thomas Cunningham, Bedabrata Pain, Christopher Wrigley, Peter Ringold
Proceedings Volume 4284, (2001) https://doi.org/10.1117/12.426872
KEYWORDS: Stars, Imaging systems, Sensors, Active sensors, Interference (communication), CMOS sensors, Error analysis, Charge-coupled devices, Point spread functions, Signal detection

Proceedings Article | 15 May 2001 Paper
Bruce Hancock, Thomas Cunningham, Kenneth McCarty, Guang Yang, Christopher Wrigley, Peter Ringold, Robert Stirbl, Bedabrata Pain
Proceedings Volume 4306, (2001) https://doi.org/10.1117/12.426989
KEYWORDS: Imaging systems, Field effect transistors, Diodes, Silicon, Oxides, Ionizing radiation, Photodiodes, Radiation effects, Charge-coupled devices, Temperature metrology

Showing 5 of 7 publications
Conference Committee Involvement (10)
Pattern Recognition and Tracking XXVIII
12 April 2017 | Anaheim, CA, United States
Optical Pattern Recognition XXVII
20 April 2016 | Baltimore, MD, United States
Optical Pattern Recognition XXVI
22 April 2015 | Baltimore, MD, United States
Optical Pattern Recognition XXV
7 May 2014 | Baltimore, MD, United States
Optical Pattern Recognition XXIV
29 April 2013 | Baltimore, Maryland, United States
Showing 5 of 10 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top