Sebastiaan P. Huber
at FOM Institute DIFFER
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 September 2013 Paper
S. Huber, R. van de Kruijs, A. Yakshin, E. Zoethout, F. Bijkerk
Proceedings Volume 8848, 884814 (2013) https://doi.org/10.1117/12.2026546
KEYWORDS: Reflectivity, Antireflective coatings, Deep ultraviolet, Thin films, Multilayers, Extreme ultraviolet, Extreme ultraviolet lithography, Silicon, Optical engineering, Mirrors

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