Silvia M. Booij
at Philips Research
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 24 September 2015 Paper
Hans Gommans, Silvia Booij, Fetze Pijlman, Marcel Krijn, Siebe de Zwart, Ruslan Sepkhanov, Dave Beaumont, Hans van der Schaft, Rene Sanders
Proceedings Volume 9628, 96281N (2015) https://doi.org/10.1117/12.2192082
KEYWORDS: Laser ablation, Photomasks, Collimation, Reflection, Image processing, Optical design, Light sources and illumination, Excimer lasers, Tolerancing, Image resolution

Proceedings Article | 12 February 2009 Paper
Armand Pruijmboom, Silvia Booij, Marcel Schemmann, Klaus Werner, Pieter Hoeven, Henri van Limpt, Steffan Intemann, Rafael Jordan, Thomas Fritzsch, Hermann Oppermann, Michel Barge
Proceedings Volume 7221, 72210S (2009) https://doi.org/10.1117/12.808810
KEYWORDS: Sensors, Vertical cavity surface emitting lasers, Semiconducting wafers, Gallium arsenide, Wafer-level optics, Laser scattering, Lens design, Silicon, Interferometers, Integrated optics

Proceedings Article | 22 December 2003 Paper
Proceedings Volume 5180, (2003) https://doi.org/10.1117/12.503679
KEYWORDS: Polishing, Surface finishing, Glasses, Reflection, Light scattering, Cerium, Scattering, Calibration, Oxides, Microscopy

Proceedings Article | 22 December 2003 Paper
Proceedings Volume 5180, (2003) https://doi.org/10.1117/12.503668
KEYWORDS: Particles, Surface finishing, Polishing, Abrasives, Surface roughness, Silicon carbide, Computer simulations, Glass processing, Microfluidics, Plasma etching

SPIE Journal Paper | 1 August 2002
OE, Vol. 41, Issue 08, (August 2002) https://doi.org/10.1117/12.10.1117/1.1489677
KEYWORDS: Particles, Abrasives, Polishing, Silicon carbide, Surface finishing, Materials processing, Optical engineering, Optical fabrication, Glasses, Surface roughness

Showing 5 of 8 publications
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