Dr. Steven R. Meier
Director Systems Engineering Group
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 15 October 2004 Paper
Proceedings Volume 5526, (2004) https://doi.org/10.1117/12.559812
KEYWORDS: Reflectivity, Carbon, Scattering, Fractal analysis, Absorption, Data modeling, Optical spheres, Reflection, Coating, Scanning electron microscopy

Proceedings Article | 15 October 2004 Paper
Proceedings Volume 5526, (2004) https://doi.org/10.1117/12.559793
KEYWORDS: Reflectivity, Carbon, Bidirectional reflectance transmission function, Infrared radiation, Scanning electron microscopy, Optical fibers, Stray light, Ultraviolet radiation, Spectroscopy, Oxygen

SPIE Journal Paper | 1 May 2002
OE, Vol. 41, Issue 05, (May 2002) https://doi.org/10.1117/12.10.1117/1.1467360
KEYWORDS: Bidirectional reflectance transmission function, Reflectivity, Scattering, Polarimetry, Picosecond phenomena, Reflection, Polarization, Data modeling, Electromagnetic scattering theory, Multiple scattering

Proceedings Article | 15 November 2000 Paper
Proceedings Volume 4133, (2000) https://doi.org/10.1117/12.406615
KEYWORDS: Polarization, Infrared radiation, Infrared materials, Mueller matrices, Data modeling, Sensors, Reflection, Gold, Electromagnetic radiation, Optical fibers

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top