Mr. Sun Kwon Kim Profile

Sun Kwon Kim

at Samsung Electronics Co Ltd

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Proceedings Article | 12 March 2013 Paper

Time-of-flight depth image enhancement using variable integration time

Sun Kwon Kim, Ouk Choi, Byongmin Kang, James Dokyoon Kim, Chang-Yeong Kim

Proceedings Volume 8650, 865007 (2013) https://doi.org/10.1117/12.2005429

KEYWORDS: Cameras, Image fusion, Signal to noise ratio, Calibration, Image enhancement, Wavelets, Time of flight cameras, Infrared cameras, Modulation, Distance measurement

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Time-of-Flight (ToF) cameras are used for a variety of applications because it delivers depth information at a high frame rate. These cameras, however, suffer from challenging problems such as noise and motion artifacts. To increase signal-to-noise ratio (SNR), the camera should calculate a distance based on a large amount of infra-red light, which needs to be integrated over a long time. On the other hand, the integration time should be short enough to suppress motion artifacts. We propose a ToF depth imaging method to combine advantages of short and long integration times exploiting an imaging fusion scheme proposed for color imaging. To calibrate depth differences due to the change of integration times, a depth transfer function is estimated by analyzing the joint histogram of depths in the two images of different integration times. The depth images are then transformed into wavelet domains and fused into a depth image with suppressed noise and low motion artifacts. To evaluate the proposed method, we captured a moving bar of a metronome with different integration times. The experiment shows the proposed method could effectively remove the motion artifacts while preserving high SNR comparable to the depth images acquired during long integration time.

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