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Tatsuya Fujishima
at Rohm Co Ltd
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Publications (1)
Proceedings Article | 8 February 2007 Paper
Thermal analysis of AlGaN/GaN HFETs using electro-thermal simulation and micro-Raman spectroscopy
Tatsuya Fujishima, Kaoru Inoue, Kenichi Kosaka, Akihiro Hinoki, Tomoyuki Yamada, Tadayoshi Tsuchiya, Junjiroh Kikawa, Shinichi Kamiya, Akira Suzuki, Tsutomu Araki, Yasushi Nanishi
Proceedings Volume 6473, 647317 (2007) https://doi.org/10.1117/12.699760
KEYWORDS: Silicon carbide, Sapphire, Temperature metrology, Micro raman spectroscopy, Gallium nitride, Computer simulations, Numerical simulations, Raman spectroscopy, Thermal analysis, Heterojunctions
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