Dr. Tim He Profile

Dr. Tim He

at Bruker AXS Inc

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 28 September 2011 Paper

T. He, R. Durst, B. Becker, J. Kaercher, G. Wachter

Proceedings Volume 8142, 81421Q (2011) https://doi.org/10.1117/12.899721

KEYWORDS: Imaging systems, Sensors, CMOS sensors, Cameras, X-rays, Electrons, X-ray imaging, Calibration, Quantum efficiency, Analog electronics

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Keywords/Phrases