Dr. Tomáš Pevný
at Cisco Systems Inc
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 4 March 2015 Paper
Proceedings Volume 9409, 94090I (2015) https://doi.org/10.1117/12.2083216
KEYWORDS: Steganalysis, Ferroelectric LCDs, Sensors, Machine learning, Databases, Cameras, Steganography, Forensic science, Gold, Picosecond phenomena

Proceedings Article | 19 February 2014 Paper
Proceedings Volume 9028, 90280I (2014) https://doi.org/10.1117/12.2038908
KEYWORDS: Sensors, Steganalysis, Ferroelectric LCDs, Binary data, Steganography, Cameras, Performance modeling, Data modeling, Plasma display panels, Feature extraction

Proceedings Article | 22 March 2013 Paper
Proceedings Volume 8665, 86650M (2013) https://doi.org/10.1117/12.2006790
KEYWORDS: Steganalysis, Sensors, Detection and tracking algorithms, Neodymium, Feature extraction, Calibration, Steganography, Feature selection, Binary data, Dimension reduction

Proceedings Article | 14 February 2012 Paper
Proceedings Volume 8303, 83030N (2012) https://doi.org/10.1117/12.910565
KEYWORDS: Steganalysis, Sensors, Web 2.0 technologies, Steganography, Clouds, Feature extraction, Databases, Cameras, Switching, Machine learning

Proceedings Article | 9 February 2012 Paper
Proceedings Volume 8303, 83030B (2012) https://doi.org/10.1117/12.908914
KEYWORDS: Neodymium, Steganalysis, Picosecond phenomena, Quantization, Digital watermarking, Forensic science, Electronic imaging, Current controlled current source, Image processing, Detection and tracking algorithms

Showing 5 of 12 publications
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