Wei Wei
at Nanjing Institute of Astronomical Optics & Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 December 2020 Presentation + Paper
Proceedings Volume 11446, 114460U (2020) https://doi.org/10.1117/12.2562070
KEYWORDS: Interferometers, Prototyping, Image resolution, Long baseline optical interferometry, Astronomy, Optical resolution, Interferometry, Optical imaging

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