Dr. Willem D. van Amstel Profile

Dr. Willem D. van Amstel

Sr. Scientist at WimOptik BV

SPIE Involvement:

Author

Publications (13)

Proceedings Article | 14 October 2004 Paper

A fast optical scanning deflectometer for measuring the topography of large silicon wafers

Stefan Krey, Willem van Amstel, Konrad Szwedowicz, Juan Campos, Alfonso Moreno, Erik Lous

Proceedings Volume 5523, (2004) https://doi.org/10.1117/12.559702

KEYWORDS: Semiconducting wafers, Mirrors, Sensors, Polishing, Optical scanning, 3D metrology, Data acquisition, Spatial resolution, Silicon, Deflectometry

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Proceedings Article | 2 November 2000 Paper

Optical testing of long cylindrical lenses by means of scanning deflectometry

Willem van Amstel, Peter van de Goor, Jef Horijon, Peter Nuyens

Proceedings Volume 4099, (2000) https://doi.org/10.1117/12.405813

KEYWORDS: Cylindrical lenses, Ray tracing, Monochromatic aberrations, Laser scanners, 3D scanning, Optical testing, Electronics, Deflectometry, Data processing, Mirrors

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Proceedings Article | 11 November 1999 Paper

Optical figure testing by scanning deflectometry

Willem van Amstel, Stefan Baumer, Jef Horijon

Proceedings Volume 3782, (1999) https://doi.org/10.1117/12.369201

KEYWORDS: Mirrors, Deflectometry, Optical components, Optical testing, Interferometers, Calibration, Optics manufacturing, Sensors, Actinium, Interferometry

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Proceedings Article | 6 September 1999 Paper

Optical figure testing by scanning deflectometry

Willem van Amstel, Stefan Baumer, Jef Horijon

Proceedings Volume 3739, (1999) https://doi.org/10.1117/12.360155

KEYWORDS: Mirrors, Deflectometry, Optical components, Optical testing, Interferometers, Calibration, Actinium, Sensors, Optics manufacturing, Interferometry

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Proceedings Article | 6 September 1999 Paper

Minideflectometer for measuring optical finish quality

Willem van Amstel, Stefan Baumer, Fred Couweleers

Proceedings Volume 3739, (1999) https://doi.org/10.1117/12.360167

KEYWORDS: Polishing, Surface finishing, Head, Mirrors, Magnetism, Spatial frequencies, Deflectometry, Optics manufacturing, Scattering, Multi-element lenses

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Proceedings Article | 6 September 1999 Paper

Cylindrical "allipse"

Willem van Amstel, R. Groenewold, T. Goos, J. van Leenders, J. Oomen

Proceedings Volume 3739, (1999) https://doi.org/10.1117/12.360134

KEYWORDS: Diamond, Mirrors, Optical testing, Ray tracing, Relays, Geometrical optics, Optical fabrication, Deflectometry, Laser scanners, 3D scanning

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Proceedings Article | 6 September 1999 Paper

Banana technology

Willem van Amstel, E. Schellekens, C. Walravens, A. Wijlaars

Proceedings Volume 3739, (1999) https://doi.org/10.1117/12.360132

KEYWORDS: Mirrors, Glasses, Laser scanners, Metals, Optical testing, Manufacturing, Optics manufacturing, Scanners, Tolerancing, Polishing

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Proceedings Article | 27 August 1999 Paper

Design of a compact 3D laser scanner

Mark Geusen, Willem van Amstel, Stefan Baumer, Jef Horijon

Proceedings Volume 3737, (1999) https://doi.org/10.1117/12.360015

KEYWORDS: Mirrors, Laser scanners, Confocal microscopy, 3D scanning, Sensors, Scanners, Inspection, Relays, Optical scanning systems, Signal detection

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Proceedings Article | 27 August 1999 Paper

Principles of the ideal scanner model: an analytical theory of the banana mirror system

Willem van Amstel

Proceedings Volume 3737, (1999) https://doi.org/10.1117/12.360013

KEYWORDS: Mirrors, Scanners, Monochromatic aberrations, Laser scanners, Polygon scanners, 3D scanning, Optical design, Fluctuations and noise, Ray tracing, Manufacturing

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Proceedings Article | 2 July 1999 Paper

Principles of the ideal scanner model: an analytical theory of the banana mirror system

Willem van Amstel

Proceedings Volume 3787, (1999) https://doi.org/10.1117/12.351638

KEYWORDS: Mirrors, Scanners, Monochromatic aberrations, Laser scanners, Polygon scanners, 3D scanning, Optical design, Fluctuations and noise, Ray tracing, Manufacturing

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