Dr. William P. Rodrigues
at Applied Materials Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 5 September 2001 Paper
Proceedings Volume 4409, (2001) https://doi.org/10.1117/12.438370
KEYWORDS: Lithography, Deep ultraviolet, Diffusion, Coating, Manufacturing, Photoresist materials, Process control, Photomasks, Critical dimension metrology, Photoresist processing

Proceedings Article | 24 August 2001 Paper
Proceedings Volume 4345, (2001) https://doi.org/10.1117/12.436813
KEYWORDS: Lithography, Deep ultraviolet, Etching, Coating, Chemistry, Manufacturing, Photomasks, Critical dimension metrology, Photoresist processing, Semiconducting wafers

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