Winghong Leung
Director of Vision Technology at ASMPT Hong Kong Ltd
SPIE Involvement:
Author
Publications (6)

SPIE Journal Paper | 21 September 2012 Open Access
Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth Fung, Wing Hong Leung, Edmund Lam
OE, Vol. 51, Issue 9, 099802, (September 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.9.099802
KEYWORDS: Phase shifts, 3D image processing, Imaging systems, Electronics engineering, Roads, Information operations, Optical engineering

SPIE Journal Paper | 13 September 2012
Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth Fung, Winghong Leung, Edmund Lam
OE, Vol. 51, Issue 9, 097001, (September 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.9.097001
KEYWORDS: Reconstruction algorithms, Phase shifts, Semiconducting wafers, Cameras, Calibration, Error analysis, Imaging systems, Inspection, 3D modeling, Projection systems

Proceedings Article | 2 February 2012 Paper
Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth Fung, W. H. Leung, Edmund Lam
Proceedings Volume 8300, 830005 (2012) https://doi.org/10.1117/12.911113
KEYWORDS: Reconstruction algorithms, Phase shifts, Calibration, Optimization (mathematics), Systems modeling, Visual process modeling, Inspection, Algorithm development, Optical design, Machine vision

Proceedings Article | 9 February 2006 Paper
Jun Cheng, Ronald Chung, Edmund Lam, Kenneth S. M. Fung, Fan Wang, W. Leung
Proceedings Volume 6070, 607003 (2006) https://doi.org/10.1117/12.648604
KEYWORDS: Binary data, Reflectivity, Inspection, Calibration, Semiconducting wafers, Sensors, Edge detection, 3D image processing, Image compression, Fringe analysis

Proceedings Article | 24 February 2005 Paper
Jun Cheng, Ronald Chung, Edmund Lam, Kenneth Fung, Fan Wang, Wing Leung
Proceedings Volume 5679, (2005) https://doi.org/10.1117/12.586628
KEYWORDS: Binary data, Inspection, Semiconducting wafers, Cameras, 3D modeling, Light sources, Ronchi rulings, Sensors, Imaging systems, 3D image reconstruction

Showing 5 of 6 publications
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