Xinfeng He
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 December 2013 Paper
Xinfeng He, Congcong Gu, Fei Chen, Xiaofeng Xu
Proceedings Volume 9068, 90680G (2013) https://doi.org/10.1117/12.2054369
KEYWORDS: Thin films, Vanadium, Transmittance, Refractive index, Optical design, Sputter deposition, Infrared radiation, System on a chip, Optical properties, Oxidation

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