Dr. Xingchen Dong Profile

Dr. Xingchen Dong

at Technische Univ München

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 5 March 2021 Presentation + Paper

Optical fiber sensors based on multimode interference using square-core fiber for temperature measurement

Kun Wang, Xingchen Dong, Michael Köhler, Patrick Kienle, Qiang Bian, Maximilian Fink, Martin Jakobi, Alexander Koch

Proceedings Volume 11693, 116930R (2021) https://doi.org/10.1117/12.2577571

KEYWORDS: Multimode fibers, Cladding, Sensors, Structured optical fibers, Single mode fibers, Fiber optics sensors, Fusion splicing, Brain-machine interfaces, Multimode interference devices, Temperature metrology

Read Abstract +

Proceedings Article | 20 September 2020 Presentation + Paper

Compact static Fourier transform spectrometer for time-resolved mid-infrared spectroscopy

Michael Köhler, Bastian Vauth, Clara Kiesselbach, Xingchen Dong, Kun Wang, Patrick Kienle, Michael Schardt, Carsten Giebeler, Benjamin Wiesent, Alexander Koch

Proceedings Volume 11537, 1153707 (2020) https://doi.org/10.1117/12.2571489

KEYWORDS: Signal to noise ratio, Mid-IR, Mirrors, Light sources, FT-IR spectroscopy, Spectroscopy, Fourier transforms, Spectral resolution, Time resolved spectroscopy, Fourier optics

Read Abstract +

Proceedings Article | 20 August 2020 Poster + Paper

Line-scan hyperspectral imaging microscopy with structured illumination

Xingchen Dong, Zhendong Li, Jie Dong, Kun Wang, Michael Köhler, Martin Jakobi, Alexander Koch

Proceedings Volume 11508, 115080U (2020) https://doi.org/10.1117/12.2565944

KEYWORDS: Hyperspectral imaging, Microscopes, Microscopy, Control systems, Spatial resolution, Digital Light Processing, Phase shifts, Line scan image sensors

Read Abstract +

Proceedings Article | 30 March 2020 Presentation + Paper

Mapping the optical dielectric response of isolated monolayer MoS2 by push-broom microspectroscopy

Xingchen Dong, Michael Köhler, Kun Wang, Martin Jakobi, Alexander Koch

Proceedings Volume 11351, 113511I (2020) https://doi.org/10.1117/12.2540501

KEYWORDS: Hyperspectral imaging, Refractive index, Optical properties, Spectroscopy, Microscopy, Dielectrics, Reflectivity, Imaging spectroscopy, Molybdenum, Light-matter interactions

Read Abstract +

Two-dimensional van der Waals materials are attractive for photonics and optoelectronics due to distinctive layerdependent optical properties. Optical properties based on light-matter interactions have been revealed by modern imaging and spectroscopy techniques. Hyperspectral imaging microscopy working in line-scan mode (push-broom microspectroscopy) can provide abundant spectral information covering a large area compared to conventional spectroscopy techniques, with a higher acquisition speed than point-scan techniques such as atomic force microscopy and Raman imaging microscopy. This contribution studies in-depth the reconstruction of 3D datacubes and the extraction of optical responses of the sample. Monolayer MoS₂, a subclass of semiconducting two-dimensional materials, is fabricated by the mechanical exfoliation method on the SiO₂/Si substrate with an oxide thickness of 285 nm. The isolated monolayer MoS₂ is observed and identified by a conventional optical microscope. The custom-built push-broom microspectroscope is utilized to scan the region of interest, with the whole spectrum of every line recorded at each frame. The spectral information of every point is collected and 3D spectral data sets are reconstructed for feature extraction and property analysis. To realize the thickness mapping of flakes, linear unmixing is employed to calculate the abundance of isolated monolayer MoS₂ on the SiO₂/Si substrate, improving flake identification performances. The characteristic spectrum of monolayer MoS₂ is acquired by averaging the spectrum from the monolayer MoS₂ flake. Furthermore, the optical dielectric response is further analyzed by Kramers-Kronig constrained analysis and Fresnel-law-based analysis. The optical dielectric function is calculated and compared based on the refractive index and medium thickness. This detailed analysis of optical dielectric responses highlights the feasibility of push-broom microspectroscopy for two-dimensional materials characterization.

Proceedings Article | 3 September 2019 Paper

Static Fourier transform mid-infrared spectrometer with continuous background correction

Michael Köhler, Michael Schardt, Hamza Ghazala, Ennio Colicchia, Patrick Kienle, Xingchen Dong, Kun Wang, Alexander Koch

Proceedings Volume 11102, 1110218 (2019) https://doi.org/10.1117/12.2528404

KEYWORDS: Mirrors, Beam splitters, Light sources, FT-IR spectroscopy, Interferometers, Sensors, Spectroscopy, Fourier transforms, Transmittance, Off axis mirrors

Read Abstract +

Proceedings Article | 21 June 2019 Presentation + Paper

Hyperspectral imaging microscopy for thickness measurement and surface characterization of layered MoS2

Xingchen Dong, Michael Köhler, Martin Jakobi, Alexander Koch

Proceedings Volume 11056, 110561S (2019) https://doi.org/10.1117/12.2530384

KEYWORDS: Hyperspectral imaging, Microscopes, Light emitting diodes, Imaging systems, Imaging spectroscopy, Molybdenum

Read Abstract +

Proceedings Article | 21 June 2019 Paper

Setup and evaluation of a static imaging Fourier transform spectrometer for the mid-infrared spectral range

Michael Köhler, The Thien Nguyen, Patrick Kienle, Xingchen Dong, Alexander Koch

Proceedings Volume 11056, 110561P (2019) https://doi.org/10.1117/12.2525600

KEYWORDS: Mirrors, Beam splitters, Light sources, Imaging systems, Interferometers, Sensors, Spectroscopy, Fourier transforms, Detector arrays, Spectral resolution

Read Abstract +

Showing 5 of 7 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years