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Yasuyuki Tanabe
at Nippon Telegraph and Telephone Corp
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Publications (1)
Proceedings Article | 2 October 2001 Paper
Method for testing electrostatic discharge tolerance for fingerprint sensor LSI
Yasuyuki Tanabe, Hideyuki Unno, Katsuyuki Machida, Norio Sato, Hiromu Ishii, Satoshi Shigematsu, Hiroki Morimura, Hakaru Kyuragi
Proceedings Volume 4558, (2001) https://doi.org/10.1117/12.442989
KEYWORDS: Sensors, Electrodes, Tolerancing, CMOS sensors, Capacitance, Scanning electron microscopy, Image sensors, Photography, Fingerprint recognition, Reliability
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