Dr. Yi Liu
at Zhejiang Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 April 2022 Paper
Kaixin Liu, R. Saminathan, Hung-Kun Shih, Stefano Sfarra, Jianguo Yang, Yi Liu, Yuan Yao
Proceedings Volume 12049, 120490F (2022) https://doi.org/10.1117/12.2612708
KEYWORDS: Defect detection, Statistical analysis, Image processing, Product engineering, Inspection, Optical inspection, Visualization, Denoising

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