Yihang Xie
at National Institute of Metrology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 April 2021 Poster + Presentation + Paper
Proceedings Volume 11772, 1177226 (2021) https://doi.org/10.1117/12.2593578
KEYWORDS: Ultraviolet radiation, Radiometry, Stray light, Temperature metrology, Light sources, Ultraviolet sources, Sensors, Optical testing, Lamps, Environmental sensing

Proceedings Article | 17 April 2020 Paper
Proceedings Volume 11455, 114553I (2020) https://doi.org/10.1117/12.2564661
KEYWORDS: Black bodies, Temperature metrology, Ultraviolet radiation, Spectral calibration, Calibration, Radiometry, Thermometry, Lithium, Metrology, Lutetium

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