Prof. Yiin-Kuen Fuh
at National Central Univ
SPIE Involvement:
Author
Publications (7)

SPIE Journal Paper | 10 April 2018
Tien-Chan Chang, Chun-An Liao, Zhi-Yu Lin, Yiin-Kuen Fuh
JM3, Vol. 17, Issue 02, 024001, (April 2018) https://doi.org/10.1117/12.10.1117/1.JMM.17.2.024001
KEYWORDS: Composites, Graphene, Interfaces, Thermal effects, Field effect transistors, Anisotropy, Electronic components, Raman spectroscopy, Particles, Transmission electron microscopy

SPIE Journal Paper | 14 September 2017
Yu-Lin Hsieh, Chien-Chieh Lee, Chia-Cheng Lu, Yiin-Kuen Fuh, Jenq-Yang Chang, Ju-Yi Lee, Tomi Li
JPE, Vol. 7, Issue 03, 035503, (September 2017) https://doi.org/10.1117/12.10.1117/1.JPE.7.035503
KEYWORDS: Interfaces, Hydrogen, Doping, Semiconducting wafers, Solar cells, Thin films, Silicon films, Silicon, Amorphous silicon, Heterojunctions

SPIE Journal Paper | 15 June 2017
Chung-Han Chen, Chieh-Tse Huang, Yiin-Kuen Fuh
JM3, Vol. 16, Issue 02, 025503, (June 2017) https://doi.org/10.1117/12.10.1117/1.JMM.16.2.025503
KEYWORDS: Tissue optics, In situ metrology, Scanning electron microscopy, Binary data, Tissues

SPIE Journal Paper | 20 December 2016
Tien-Chan Chang, Yiin-Kuen Fuh, Rui-Zhong Lee, Li-Yuan Liu, Yueh-Mu Lee
JM3, Vol. 15, Issue 04, 044503, (December 2016) https://doi.org/10.1117/12.10.1117/1.JMM.15.4.044503
KEYWORDS: Composites, Field effect transistors, Interfaces, Nanostructuring, Anisotropy, Silver, Scanning electron microscopy, Carbon, Temperature metrology, Resistance

SPIE Journal Paper | 13 October 2015
Chu-Lin Chu, Bo-Yuan Chen, Yiin-Kuen Fuh
JM3, Vol. 14, Issue 04, 044501, (October 2015) https://doi.org/10.1117/12.10.1117/1.JMM.14.4.044501
KEYWORDS: Germanium, Atomic layer deposition, Aluminum, Field effect transistors, Interfaces, Dielectrics, Molybdenum, Oxides, Gallium arsenide, Silicon

Showing 5 of 7 publications
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