Dr. Yilmaz Dikme Profile

Dr. Yilmaz Dikme

at AIXTRON SE

SPIE Involvement:

Author

Publications (3)

Proceedings Article | 21 June 2004 Paper

Investigation of AlGaN buffer layers on sapphire grown by MOVPE

Philipp van Gemmern, Yilmaz Dikme, Necmi Biyikli, Holger Kalisch, Ekmel Ozbay, Rolf Jansen, Michael Heuken

Proceedings Volume 5366, (2004) https://doi.org/10.1117/12.529952

KEYWORDS: Aluminum, Aluminum nitride, Sapphire, Spectroscopy, Gallium, Hydrogen, Light emitting diodes, Reflectivity, Transmittance, Optical testing

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Proceedings Article | 3 July 2003 Paper

Investigation of GaN on Si(111) for optoelectronic applications

Y. Dikme, A. Szymakowski, H. Kalisch, E.V Lutsenko, V.N. Zubialevich, G.P. Yablonskii, H.M. Chern, C. Schaefer, R. Jansen, Michael Heuken

Proceedings Volume 4996, (2003) https://doi.org/10.1117/12.476571

KEYWORDS: Gallium nitride, Silicon, Aluminum nitride, Silicon carbide, Electroluminescence, Reflectivity, Heterojunctions, Laser optics, Laser damage threshold, Sapphire

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Proceedings Article | 11 June 2003 Paper

Production scale MOVPE reactors for electronic and optoelectronic applications

Harry Protzmann, Georg Gerstenbrandt, Assadullah Alam, Oliver Schoen, Markus Luenenbuerger, Yilmaz Dikme, Holger Kalisch, Rolf Jansen, Michael Heuken

Proceedings Volume 5023, (2003) https://doi.org/10.1117/12.511364

KEYWORDS: Semiconducting wafers, Gallium nitride, Silicon, Luminescence, Optoelectronics, Resistance, Field effect transistors, Silver, Metalorganic chemical vapor deposition, LED displays

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