Dr. Yutian Ma Profile

Dr. Yutian Ma

at Institute of Electrical Engineering

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 6 February 2019 Paper

A true-color nano-CT based on SEM

Weixia Zhao, Junbiao Liu, Geng Niu, Yutian Ma, Yan Wang, Li Han

Proceedings Volume 10842, 108420P (2019) https://doi.org/10.1117/12.2504965

KEYWORDS: X-rays, X-ray computed tomography, X-ray imaging, Image segmentation, Scanning electron microscopy, CT reconstruction, Computed tomography, Principal component analysis, Chromium

Read Abstract +

Proceedings Article | 24 January 2019 Paper

Design and fabrication of a new tungsten-diamond transmission target for micro-computed tomography

Geng Niu, Junbiao Liu, Yutian Ma, Han Li, Weixia Zhao

Proceedings Volume 10840, 108400X (2019) https://doi.org/10.1117/12.2506351

KEYWORDS: X-rays, Electron beams, Monte Carlo methods, Sputter deposition

Read Abstract +

Proceedings Article | 25 October 2016 Paper

Research on the electron beam spot detection methods based on SEM

Weixia Zhao, Junbiao Liu, Geng Niu, Yutian Ma, Li Han

Proceedings Volume 9687, 96870C (2016) https://doi.org/10.1117/12.2245029

KEYWORDS: Electron beams, Scanning electron microscopy, X-ray sources, Edge detection, Reticles, Calibration, Semiconducting wafers, Signal detection, Silicon, Metals

Read Abstract +

Proceedings Article | 25 October 2016 Paper

X-ray microscopy using reflection targets based on SEM with tungsten filament

Junbiao Liu, Yutian Ma, Weixia Zhao, Geng Niu, Mingzhang Chu, Bohua Yin, Li Han, Baodong Liu

Proceedings Volume 9685, 96850I (2016) https://doi.org/10.1117/12.2241728

KEYWORDS: X-ray microscopy, Scanning electron microscopy, Tungsten, X-ray imaging, X-rays, Electron beams, Sensors, X-ray detectors, Signal attenuation, Beryllium

Read Abstract +

Proceedings Article | 25 October 2016 Paper

Researches on stability of microfocus electron-impact x-ray source

Yu-tian Ma, Jun-Biao Liu, Wei-xia Zhao, Geng Niu, Li Han

Proceedings Volume 9685, 96850J (2016) https://doi.org/10.1117/12.2243125

KEYWORDS: X-ray sources, X-rays, Electron beams, Magnetism, Spatial resolution, Tungsten, Lenses, X-ray imaging, Electrodes, Sensors

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years