Dr. Francois Demangeot
at Univ of Toulouse
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 March 2013 Paper
J. Wang, C. Bayon, F. Demangeot, R. Pechou, A. Mlayah, A. Cros, B. Daudin
Proceedings Volume 8625, 86250P (2013) https://doi.org/10.1117/12.2001564
KEYWORDS: Gallium nitride, Raman spectroscopy, Atomic force microscopy, Aluminum, Scanning electron microscopy, Micro raman spectroscopy, Phonons, Ultraviolet radiation, Dielectrics, Nanowires

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