SignificanceFourier ptychographic microscopy (FPM) is a new, developing computational imaging technology. It can realize the quantitative phase imaging of a wide field of view and high-resolution (HR) simultaneously by means of multi-angle illumination via a light emitting diode (LED) array, combined with a phase recovery algorithm and the synthetic aperture principle. However, in the FPM reconstruction process, LED position misalignment affects the quality of the reconstructed image, and the reconstruction efficiency of the existing LED position correction algorithms needs to be improved.AimThis study aims to improve the FPM correction method based on simulated annealing (SA) and proposes a position misalignment correction method (AA-C algorithm) using an improved phase recovery strategy.ApproachThe spectrum function update strategy was optimized by adding an adaptive control factor, and the reconstruction efficiency of the algorithm was improved.ResultsThe experimental results show that the proposed method is effective and robust for position misalignment correction of LED arrays in FPM, and the convergence speed can be improved by 21.2% and 54.9% compared with SC-FPM and PC-FPM, respectively.ConclusionsThese results can reduce the requirement of the FPM system for LED array accuracy and improve robustness.
To accomplish the interference testing to an off-axis parabolic mirror, we provided a kind of hybrid compensation modal combining compensator with stitching testing. To verify the validity of the above modal, we measured a Φ1450mm off-axis parabolic mirror with the above method. It can be seen from the stitching map that the stitching map is smooth and continuous in the full aperture. At the same time, to evaluate the stitching testing accuracy, we compared the stitching testing map and the subaperture testing map. It shows that the RMS of the residual map between them is 0.003λ, verifying the validity and accuracy of the model.
To accomplish the alignment between processing and testing coordinates in the manufacturing of SiC flat mirror, which can be used to assure the acquisition of final surface, we established a kind of model based on least square method. With actual project, we achieved the alignment of two coordinates in the manufacturing of a φ800mm flat mirror. The surface reached the final accuracy with this alignment model, which verified the accuracy and reliability of this alignment model.
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