CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 10310
PROCEEDINGS VOLUME 10310
SPIE INSTITUTES FOR ADVANCED OPTICAL TECHNOLOGIES 10 | 3-3 OCTOBER 1993
Technology of Proximal Probe Lithography
Editor(s): Christie R. K. Marrian
Editor Affiliations +
IN THIS VOLUME
1 Sessions, 19 Papers, 0 Presentations
Technology of Proximal Probe Lithography  (19)
SPIE INSTITUTES FOR ADVANCED OPTICAL TECHNOLOGIES 10
3-3 October 1993
Bellingham, WA, United States
Present at an SPIE Conference
Subscribe to Digital Library
VIEW ALL ABSTRACTS +
Technology of Proximal Probe Lithography
Front Matter: Volume 10310 Open Access Paper
Proceedings Volume Technology of Proximal Probe Lithography, 1031001 (1993) https://doi.org/10.1117/12.2283725
Read Abstract +
DOWNLOAD PAPER
Technology of proximal probe lithography: an overview Paper
Proceedings Volume Technology of Proximal Probe Lithography, 1031002 (1993) https://doi.org/10.1117/12.183184
Read Abstract +
Principles and techniques of STM lithography Paper
Mark A. McCord, Roger Fabian W. Pease
Proceedings Volume Technology of Proximal Probe Lithography, 1031003 (1993) https://doi.org/10.1117/12.183194
Read Abstract +
Role of scanning probe microscopes in the development of nanoelectric devices Paper
Arunava Majumdar, Stuart M. Lindsay
Proceedings Volume Technology of Proximal Probe Lithography, 1031004 (1993) https://doi.org/10.1117/12.183195
Read Abstract +
Low voltage E-beam lithography with the STM Paper
Proceedings Volume Technology of Proximal Probe Lithography, 1031005 (1993) https://doi.org/10.1117/12.183196
Read Abstract +
Nanolithography and atomic manipulation on silicon surfaces by STM Paper
Francois Grey, A. Kobayashi, H. Uchida, D. H. Huang, M. Aono
Proceedings Volume Technology of Proximal Probe Lithography, 1031006 (1993) https://doi.org/10.1117/12.183197
Read Abstract +
Scanning tunneling microscope-based fabrication and characteerization on passivated semiconductor surfaces Paper
John A. Dagata, Jason Schneir
Proceedings Volume Technology of Proximal Probe Lithography, 1031007 (1993) https://doi.org/10.1117/12.183198
Read Abstract +
Scanning tunneling microscope-based nanolithography for electronic device fabrication Paper
Joseph W. Lyding, Roger T. Brockenbrough, Patrick J. Fay, John R. Tucker, Karl Hess
Proceedings Volume Technology of Proximal Probe Lithography, 1031008 (1993) https://doi.org/10.1117/12.183199
Read Abstract +
Arrayed lithography using STM-based microcolumns Paper
T. H. Philip Chang, Lawrence P. Muray, Urs Staufer, Mark A. McCord, Dieter P. Kern
Proceedings Volume Technology of Proximal Probe Lithography, 1031009 (1993) https://doi.org/10.1117/12.183200
Read Abstract +
Nanofabrication by scanning probe instruments: methods, potentail applications and key issues Paper
Proceedings Volume Technology of Proximal Probe Lithography, 103100A (1993) https://doi.org/10.1117/12.183201
Read Abstract +
Direct writing of metallic nanostructures with the scanning tunneling microscope Paper
Alejandro L. de Lozanne, W. F. Smith, E. E. Ehrichs
Proceedings Volume Technology of Proximal Probe Lithography, 103100B (1993) https://doi.org/10.1117/12.183185
Read Abstract +
Fabrication of nanometer scale structures Paper
Mahir A. Nayfeh
Proceedings Volume Technology of Proximal Probe Lithography, 103100C (1993) https://doi.org/10.1117/12.183186
Read Abstract +
Modification and manipulation of layered materials using scanned probe microscopies Paper
Charles Lieber
Proceedings Volume Technology of Proximal Probe Lithography, 103100D (1993) https://doi.org/10.1117/12.183187
Read Abstract +
Atomic force microscopy experimentation at surfaces: hardness, wear and lithographic applications Paper
T. A. Jung, A. Moser, Michael T. Gale, H. J. Hug, U. D. Schwarz
Proceedings Volume Technology of Proximal Probe Lithography, 103100E (1993) https://doi.org/10.1117/12.183188
Read Abstract +
Fabrication and characterization using scanned nanoprobes Paper
Grover C. Wetsel, Sterling E. McBride, Herschel M. Marchman
Proceedings Volume Technology of Proximal Probe Lithography, 103100F (1993) https://doi.org/10.1117/12.183189
Read Abstract +
Ballistic electron emission microscopy: from electron transport physics to nanoscale materials science Paper
Proceedings Volume Technology of Proximal Probe Lithography, 103100G (1993) https://doi.org/10.1117/12.183190
Read Abstract +
Generating and measuring displacements up to 0.1m to an accuracy of0.1 nm: is it possible? Paper
E. Clayton Teague
Proceedings Volume Technology of Proximal Probe Lithography, 103100H (1993) https://doi.org/10.1117/12.183191
Read Abstract +
Metrology with scanning probe microscopes Paper
Joseph E. Griffith, David A. Grigg, G. P. Kochanski, Michael J. Vasile, Phillip E. Russell
Proceedings Volume Technology of Proximal Probe Lithography, 103100I (1993) https://doi.org/10.1117/12.183192
Read Abstract +
Metrology applications of scanning probe microscopes Paper
Leigh Ann Files-Sesler, John N. Randall, Francis G. Celii
Proceedings Volume Technology of Proximal Probe Lithography, 103100J (1993) https://doi.org/10.1117/12.183193
Read Abstract +
Back to Top