Optical characterization of materials in sol-gel dip coatings

Maria Cristina Ferrara; Saverio Mazzarelli; Jordi Sancho-Parramon; Salvador Bosch

doi:10.1117/12.530760

19 November 2003 Optical characterization of materials in sol-gel dip coatings

Maria Cristina Ferrara, Saverio Mazzarelli, Jordi Sancho-Parramon, Salvador Bosch

Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.530760
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy

Abstract

Optical properties of materials inside a multilayer stack may differ from those of single layers. This fact is specially noticeable in the case of sol-gel films obtained by dip coatings. We propose a method to determine the refractive index and thickness of materials inside a multilayer stack, based on the simultaneous characterization of several samples. The procedure increases the reliability of the results and helps in improving quality in optical coating production. (Summary only available)

Citation Download Citation

Maria Cristina Ferrara, Saverio Mazzarelli, Jordi Sancho-Parramon, and Salvador Bosch "Optical characterization of materials in sol-gel dip coatings", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); https://doi.org/10.1117/12.530760

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