PROCEEDINGS VOLUME 7511
INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTATION AND TECHNOLOGY | 19-22 OCTOBER 2009
2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Editor(s): Shenghua Ye, Guangjun Zhang, Jun Ni
Editor Affiliations +
IN THIS VOLUME

5 Sessions, 78 Papers, 0 Presentations, 0 Posters
INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTATION AND TECHNOLOGY
19-22 October 2009
Shanghai, China
Front Matter: Volume 7511
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751101 (2010) https://doi.org/10.1117/12.846029
Imaging and Spectroscopy
Yuan-Fang Chen, Yi-liang Du
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751102 (2009) https://doi.org/10.1117/12.836308
Zonghua Zhang, Sixiang Zhang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751103 (2009) https://doi.org/10.1117/12.837853
Tingting Zhou, Shiyuan Liu, Wei Liu, Lijuan Wang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751104 (2009) https://doi.org/10.1117/12.837770
Qieni Lü, Baozhen Ge, Yiliang Chen, Jin Zou
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751105 (2009) https://doi.org/10.1117/12.837812
Lijuan Wang, Shiyuan Liu, Wei Liu, Tingting Zhou
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751106 (2009) https://doi.org/10.1117/12.837771
Ranxi Zhang, Bin Yang, Yan Zhang, Robert S. Donnan
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751107 (2009) https://doi.org/10.1117/12.839690
Bo Huang, Caihong Dai, Jailin Yu
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751108 (2009) https://doi.org/10.1117/12.837955
Abdul Wahid Khan, Wuyi Chen
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751109 (2009) https://doi.org/10.1117/12.839861
Jun Xiang, Peng Han
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110A (2009) https://doi.org/10.1117/12.840121
Interferometer
Osami Sasaki, Hiroshi Ueno, Takamasa Suzuki
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110B (2009) https://doi.org/10.1117/12.840190
Min Li, Fang Xie, Junyu Ren
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110C (2009) https://doi.org/10.1117/12.837952
Zhao Wang, Wei Zhang, Zhi-bin Ren
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110D (2009) https://doi.org/10.1117/12.835988
Dagong Jia, Yong Zhu, Xuemin Zhang, Hongxia Zhang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110E (2009) https://doi.org/10.1117/12.837453
Hongxia Zhang, Di Wu, Dagong Jia, Yimo Zhang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110F (2009) https://doi.org/10.1117/12.837519
Li Liu, Li Yan, Yaocheng Xie, Songzhang Li, Ge Xia, Libin Zhou
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110G (2009) https://doi.org/10.1117/12.838029
Hao-ming Wei, Ting-wen Xing
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110H (2009) https://doi.org/10.1117/12.837606
Kaiduan Yue, Mei Yuan, Yaxing Yi, Zhongke Li, Fei Zhang, Longfei Jian
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110I (2009) https://doi.org/10.1117/12.837776
Shiming Wei, Lifeng Li
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110J (2009) https://doi.org/10.1117/12.837778
Abdul Wahid Khan, Wuyi Chen, Lili Wu
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110K (2009) https://doi.org/10.1117/12.839866
Optoelectric Measurement
Qing Ye, Xiaoquan Sun, Li Shao, Yafu Wang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110L (2009) https://doi.org/10.1117/12.837910
Qixing Zhang, Lifeng Qiao, Jinjun Wang, Jun Fang, Yongming Zhang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110M (2009) https://doi.org/10.1117/12.838276
Yan Huo, Yue-jin Zhao, Cun-lin Zhang, Yan-hong Li, Zhi Zeng
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110N (2009) https://doi.org/10.1117/12.837816
Takamasa Suzuki, Ryuichi Nagai, Osami Sasaki
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110O (2009) https://doi.org/10.1117/12.839828
Chunxia Feng, Lihua Huang, Jie Han, Guangchao Zhou, Aijun Zeng, Yongkai Zhao, Huijie Huang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110P (2009) https://doi.org/10.1117/12.837919
Xiwen Qiang, Jingru Liu, Fei Zong, Junwei Zhao, Yan Li
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110Q (2009) https://doi.org/10.1117/12.837988
Jie Han, Aijun Zeng, Chunxia Feng, Guangchao Zhou, Huijie Huang, Hongbing Qian
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110R (2009) https://doi.org/10.1117/12.838050
Lei Ma, Yizhong Wang, Qingyang Xu, Huafang Huang, Ning Chen
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110S (2009) https://doi.org/10.1117/12.838229
Quanxin Ding, Hua Liu
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110T (2009) https://doi.org/10.1117/12.838218
Hai-bo Liu, Ji-chun Tan, Shui-hua Huang, Xiu-jian Li, Li Liu, Wei Tan
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110U (2009) https://doi.org/10.1117/12.839991
Poster Session
Haitao Yan, Zhiqiang Zhen, Zhengxin Tang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110V (2009) https://doi.org/10.1117/12.835998
Zhao Wang, Zhong-hui Hu, Wei Zhang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110W (2009) https://doi.org/10.1117/12.836114
Youtang Gao, Si Tian, Jianliang Qiao, Jun Niu, Benkang Chang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110Y (2009) https://doi.org/10.1117/12.837142
Xu-guang Bai, Sheng Cai, Ming Dai
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110Z (2009) https://doi.org/10.1117/12.837317
Yang Liu, Huiying Xu
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751110 (2009) https://doi.org/10.1117/12.837510
Shao-yong Deng, Qi Zhang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751111 (2009) https://doi.org/10.1117/12.837569
Ji-hua Wen, Li-ping Jia, Yue-hong Zhu
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751112 (2009) https://doi.org/10.1117/12.837570
Jun-hong Su, Jin-man Ge
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751113 (2009) https://doi.org/10.1117/12.837583
Lixia Yang, Zhiming Wu, Kai Yuan, Yadong Jiang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751114 (2009) https://doi.org/10.1117/12.837586
Ji-hua Chen, Yan-yun Jiang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751115 (2009) https://doi.org/10.1117/12.837650
Lei Shao, Hongli Liu, Chengzhi Jiang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751116 (2009) https://doi.org/10.1117/12.837714
Shuangxi Zhang, Xuqiang Wu, Fei Ai, Chengmei Zhang, Bo Zhang, Benli Yu
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751117 (2009) https://doi.org/10.1117/12.837737
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751118 (2009) https://doi.org/10.1117/12.837739
Xu Chen, Weiqi Liu
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751119 (2009) https://doi.org/10.1117/12.837750
Xueshun Shi, Kunfeng Chen, Hongyuan Liu, Hengfei Wang, Quanshe Sun
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111A (2009) https://doi.org/10.1117/12.837791
Yong Lv, Qibo Feng, Lishuang Liu, Qingshan Chen
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111B (2009) https://doi.org/10.1117/12.837802
Peng Liu, Yinchao Zhang, Siying Chen, Tian Lan, Yuzhao Wang, Zongjia Qiu, Weiguo Kong, Guoqiang Ni
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111C (2009) https://doi.org/10.1117/12.837805
Yunqiang Sun, Fengjie Xi, Xiaojun Xu, Qisheng Lu, Wuming Wu, Hongbin Chen
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111D (2009) https://doi.org/10.1117/12.837820
Zuohuah Huang, Lijuan Wang, Zhenjiang He
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111E (2009) https://doi.org/10.1117/12.837845
Yaxing Yi, Kaiduan Yue, Mei Yuan
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111F (2009) https://doi.org/10.1117/12.837848
Kaihua Wu, Zhengjie Li, Shaopeng Hu
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111G (2009) https://doi.org/10.1117/12.837858
Ju Ren, Jian-lin Zhao
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111H (2009) https://doi.org/10.1117/12.837861
Yuzhao Wang, Yinchao Zhang, Siying Chen, Tian Lan, Zongjia Qiu, Weiguo Kong, Peng Liu, Guoqiang Ni
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111I (2009) https://doi.org/10.1117/12.837867
Qingshan Chen, Yueqiang Li, Yong Lu, Feng Jiang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111J (2009) https://doi.org/10.1117/12.837887
Dong Chu, Xing-zhi Gong, Liang Cheng, Fei-hong Yu
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111K (2009) https://doi.org/10.1117/12.837924
Ze-xin Xiao, Binzhou Zhan, Haimei Han
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111L (2009) https://doi.org/10.1117/12.837933
Xiaolin Wang, Xiaojun Xu, Pu Zhou, Haotong Ma, Zejin Liu
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111M (2009) https://doi.org/10.1117/12.837951
Zhaoxia Wu, Aijuan Song, Tiegen Liu, Zhiquan Li
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111N (2009) https://doi.org/10.1117/12.837972
Xun Yu, Hui Wang, Ji'an Wu, Fang Wang, Qian Li
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111O (2009) https://doi.org/10.1117/12.838014
Jun Han, Jin Zhang, Ji'an Wu, Fang Wang, Chi Zhang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111P (2009) https://doi.org/10.1117/12.838015
Q. W. Wang, T. Sun, C. S. Han, S. Dong, A. Yu. Rodionov, A. S. Shirin, V. N. Skekhtman
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111Q (2009) https://doi.org/10.1117/12.838053
Weihong Bi, Ailing Tan, Yong Zhao, Meijing Gao
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111R (2009) https://doi.org/10.1117/12.838054
Bo Liu, Dong Ye, Rensheng Che
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111S (2009) https://doi.org/10.1117/12.838056
Chunyan Zheng, Jian Wu
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111T (2009) https://doi.org/10.1117/12.838085
Xun Yu, Qian Li, Xu Jiang, Fang Wang, Hui Wang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111U (2009) https://doi.org/10.1117/12.838098
Li Gu, Qinlao Yang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111V (2009) https://doi.org/10.1117/12.838112
Weiguo Kong, Siying Chen, Yinchao Zhang, Tian Lan, Zongjia Qiu, Yuzhao Wang, Peng Liu, Guoqiang Ni
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111W (2009) https://doi.org/10.1117/12.838116
Kai Yang, Ben Xu, ShaoTao Zhi
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111X (2009) https://doi.org/10.1117/12.838123
Yanpeng Wu, Chongfang Ma
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111Y (2009) https://doi.org/10.1117/12.838129
Yanpeng Wu, Fan Zhang, Deying Li
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111Z (2009) https://doi.org/10.1117/12.838149
Jianxin Qiu, Pin Zhong
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751120 (2009) https://doi.org/10.1117/12.838182
A. H. Chen, H. Y. Zeng, G. L. Jiang, P. Y. Zhu
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751121 (2009) https://doi.org/10.1117/12.838195
P. Zhong, Ye Jin
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751122 (2009) https://doi.org/10.1117/12.838210
Zongjia Qiu, Siying Chen, Yinchao Zhang, Tian Lan, Yuzhao Wang, Weiguo Kong, Peng Liu, Guoqiang Ni
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751123 (2009) https://doi.org/10.1117/12.838220
Xianzhong Jian, Lihui Guo, Huaisheng Wang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751124 (2009) https://doi.org/10.1117/12.838358
Husile Mergid, Zhanhua Huang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751125 (2009) https://doi.org/10.1117/12.839674
Long-jiang Chen, Yi-yong Liang, Jian-bo Luo, Chun-hui Zhang, Guo-guang Yang
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751126 (2009) https://doi.org/10.1117/12.839934
Xuedian Zhang, Min Chang, Kexin Xu
Proceedings Volume 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751127 (2009) https://doi.org/10.1117/12.841075
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