Paper
23 September 2011 High-quality vertical light emitting diodes fabrication by mechanical lift-off technique
Po-Min Tu, Shih-Chieh Hsu, Chun-Yen Chang
Author Affiliations +
Abstract
We report the fabrication of mechanical lift-off high quality thin GaN with Hexagonal Inversed Pyramid (HIP) structures for vertical light emitting diodes (V-LEDs). The HIP structures were formed at the GaN/sapphire substrate interface under high temperature during KOH wet etching process. The average threading dislocation density (TDD) was estimated by transmission electron microscopy (TEM) and found the reduction from 2×109 to 1×108 cm-2. Raman spectroscopy analysis revealed that the compressive stress of GaN epilayer was effectively relieved in the thin-GaN LED with HIP structures. Finally, the mechanical lift-off process is claimed to be successful by using the HIP structures as a sacrificial layer during wafer bonding process.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Po-Min Tu, Shih-Chieh Hsu, and Chun-Yen Chang "High-quality vertical light emitting diodes fabrication by mechanical lift-off technique", Proc. SPIE 8123, Eleventh International Conference on Solid State Lighting, 81230R (23 September 2011); https://doi.org/10.1117/12.893237
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Gallium nitride

Light emitting diodes

Sapphire

Interfaces

Wafer bonding

Fabrication

Raman spectroscopy

RELATED CONTENT

GaN based light emitting diodes by laser lift off with...
Proceedings of SPIE (September 19 2013)
Growth of self-standing GaN substrates
Proceedings of SPIE (March 10 2010)
GaN based LEDs with air voids prepared by laser scribing...
Proceedings of SPIE (February 06 2012)
Characterization of low defect density a plane and m plane...
Proceedings of SPIE (February 06 2007)

Back to Top