New ray-tracing capabilities for the development of silicon pore optics

Giuseppe Vacanti; Nicolas Barrière; Abdelhakim Chatbi; Maximilien Collon; Ramses Günther; Alexei Yanson; Mark Vervest; Marcos Bavdaz; Eric Wille

doi:10.1117/12.2188133

4 September 2015 New ray-tracing capabilities for the development of silicon pore optics

Giuseppe Vacanti, Nicolas Barrière, Abdelhakim Chatbi, Maximilien Collon, Ramses Günther, Alexei Yanson, Mark Vervest, Marcos Bavdaz, Eric Wille

Author Affiliations +

Proceedings Volume 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII; 96030G (2015) https://doi.org/10.1117/12.2188133
Event: SPIE Optical Engineering + Applications, 2015, San Diego, California, United States

Abstract

The Geant4 based ray-tracer used to support the development of Silicon Pore Optics is being extended to take into account more subtle effects that affect the performance of the optics, like thermo-mechanical stresses and detailed surface metrology. Its performance has also been increased to make it possible to simulate rapidly and in detail the optics of Athena so that various possible configurations can be explored and characterized providing important feedback to the development and system teams. In this paper we report on the state of the development.

Citation Download Citation

Giuseppe Vacanti, Nicolas Barrière, Abdelhakim Chatbi, Maximilien Collon, Ramses Günther, Alexei Yanson, Mark Vervest, Marcos Bavdaz, and Eric Wille "New ray-tracing capabilities for the development of silicon pore optics", Proc. SPIE 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII, 96030G (4 September 2015); https://doi.org/10.1117/12.2188133

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