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Silicon Pore Optics are made of commercial Si wafers using process technology adapted from the semiconductor industry. We present the manufacturing process ranging from single mirror plates towards complete focusing mirror modules mounted in flight configuration. The performance of the mirror modules is tested using X-ray pencil beams or full X-ray illumination. In 2009, an angular resolution of 9 arcsec was achieved, demonstrating the improvement of the technology compared to 17 arcsec in 2007. Further development activities of Silicon Pore Optics concentrate on ruggedizing the mounting system and performing environmental tests, integrating baffles into the mirror modules and assessing the mass production.
Performance testing of an off-plane reflection grating and silicon pore optic spectrograph at PANTER
We present first results of demonstrating Silicon Pore Optics for the extreme radial positions of the Athena telescope. For the inner most radii (0.25 m) a new mirror plate design is shown which overcomes the challenges of larger curvatures, higher stress values and bigger plates. Preliminary designs for the mounting system and its mechanical properties are discussed for mirror modules covering all other radial positions up to the most outer radius of the Athena telescope.
Future high energy astrophysics missions will require high performance novel X-ray optics to explore the Universe beyond the limits of the currently operating Chandra and Newton observatories. Innovative optics technologies are therefore being developed and matured by the European Space Agency (ESA) in collaboration with research institutions and industry, enabling leading-edge future science missions.
Silicon Pore Optics (SPO) [1 to 21] and Slumped Glass Optics (SGO) [22 to 29] are lightweight high performance X-ray optics technologies being developed in Europe, driven by applications in observatory class high energy astrophysics missions, aiming at angular resolutions of 5” and providing effective areas of one or more square meters at a few keV.
This paper reports on the development activities led by ESA, and the status of the SPO and SGO technologies, including progress on high performance multilayer reflective coatings [30 to 35]. In addition, the progress with the X-ray test facilities and associated beam-lines is discussed [36].
Silicon Pore Optics is an enabling technology for future L- and M-class astrophysics X-ray missions, which require high angular resolution (~5 arc seconds) and large effective area (1 to 2 m2 at a few keV). The technology exploits the high-quality of super-polished 300 mm silicon wafers and the associated industrial mass production processes, which are readily available in the semiconductor industry. The plan-parallel wafers have a surface roughness better than 0.1 nm rms and are diced, structured, wedged, coated, bent and stacked to form modular Silicon Pore Optics, which can be grouped into a larger optic. The modules are assembled from silicon alone, with all the mechanical advantages, and form an intrinsically stiff pore structure.
The optics design was initially based on long (25 to 50 m) focal length X-ray telescopes, which could achieve several arc second angular resolution by curving the silicon mirror in only one direction (conical approximation).
Recently shorter focal length missions (10 to 20 m) have been discussed, for which we started to develop Silicon Pore Optics having a secondary curvature in the mirror, allowing the production of Wolter-I type optics, which are on axis aberration-free.
In this paper we will present the new manufacturing process, the results achieved and the lessons learned.
The characterization of large aperture (> 2 meters), long focal length (> 10 meters) X-ray mirrors for X-ray astronomy with synchrotron radiation poses signi cant problems related to the available space at synchrotron radiation facilities. Intrafocal pencil beam characterization of part of the optics is advantageous if its results can be shown to have predictive capabilities with respect to the full system.
In this paper we present the routine characterization of silicon pore optics at the X-ray Pencil Beam Facility of the Physikalisch-Technische Bundesanstalt, located at the synchrotron radiation facility BESSY II (Berlin, Germany). In particular we show how measurements taken in the standard beamline con guration (detector at ve meters from the optics) can e ectively be used to predict the optical performance of the optics at their design focal length by comparing data taken on 20-meter focal length Silicon Pore Optics unit in the 20-meter beamline con guration (available only for a few weeks every year) with extrapolated 5-meter measurements.
Cosine has developed the technology to bend and directly bond Si mirror plates in order to produce stiff, lightweight Xray optics which are used for large area space based X-ray telescopes. This technology, Silicon Pore Optics (SPO), also allows us to produce other types of high energy optics. Here we present the latest developments in the design and manufacture of a new generation of soft gamma-ray Laue lenses made using SPO technology named Silicon Laue lens Components: SiLC.
The bending and bonding of 300 μm thin Si single crystals allows us to fabricate a single crystal with radially curved crystal planes, which strongly improves the focusing properties of a Laue lens. The size of the focal spot is no longer determined by the size of the individual single crystals, but by the accuracy of the applied curvature, which is as low as a few seconds of arc. Furthermore, a wedge is incorporated in each individual Si crystal to ensure that all crystals are confocal in the radial direction. A secondary curvature in the axial direction can be used to improve the reflectivity of each crystal, and increase the reflected energy bandwidth.
We present the first SiLC crystals which will be manufactured in the fall of 2013. These are technology demonstrators designed for 125 keV radiation, 3.4m focal length and 600mm2 frontal area. The first measurements at synchrotron radiation facilities are planned for November 2013. With these first prototype lenses we want to demonstrate that the SPO stacking technology can be successfully applied to non-ribbed Si wafer plates and subsequently demonstrate the correct focusing in Laue geometry of both the wedges and radial curvature.
Silicon Pore Optics (SPO) provide a high angular resolution with a low areal density as required for future X-ray telescopes for high energy astrophysics. We present progress in two areas of ESA’s SPO development activities: Stray light baffling and environmental qualification.
Residual stray light originating from off-axis sources or the sky background can be blocked by placing suitable baffles in front of the mirror modules. We developed two different mechanical implementations. The first uses longer, tapered mirror plates which improve the stray light rejection without the need of mounting additional parts to the modules or the telescope. The second method is based on placing a sieve plate in front of the optics. We compare both methods in terms of baffling performance using ray-tracing simulations and present test results of prototype mirror modules.
Any optics for space telescopes needs to be compliant with the harsh conditions of the launch and in-orbit operation. We present new work in improving the mechanical and thermal ruggedness of SPO mirror modules and show recent results of qualification level tests, including tests of modules with externally mounted sieve plate baffles.
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