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22 December 2015 Performance testing of an off-plane reflection grating and silicon pore optic spectrograph at PANTER
Hannah R. Marlowe, Randall L. McEntaffer, Ryan Allured, Casey T. DeRoo, Benjamin D. Donovan, Drew M. Miles, James H. Tutt, Vadim Burwitz, Benedikt Menz, Gisela D. Hartner, Randall K. Smith, Peter N. Cheimets, Edward Hertz, Jay A. Bookbinder, Ramses Günther, Alex Yanson, Giuseppe Vacanti, Marcelo D. Ackermann
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Journal of Astronomical Telescopes, Instruments, and Systems, Vol. 1, Issue 4, 045004 (December 2015). https://doi.org/10.1117/1.JATIS.1.4.045004
Abstract
An x-ray spectrograph consisting of aligned, radially ruled off-plane reflection gratings and silicon pore optics (SPO) was tested at the Max Planck Institute for Extraterrestrial Physics PANTER x-ray test facility. SPO is a test module for the proposed Arcus mission, which will also feature aligned off-plane reflection gratings. This test is the first time two off-plane gratings were actively aligned to each other and with an SPO to produce an overlapped spectrum. We report the performance of the complete spectrograph utilizing the aligned gratings module and plans for future development.
CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
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Hannah R. Marlowe, Randall L. McEntaffer, Ryan Allured, Casey T. DeRoo, Benjamin D. Donovan, Drew M. Miles, James H. Tutt, Vadim Burwitz, Benedikt Menz, Gisela D. Hartner, Randall K. Smith, Peter N. Cheimets, Edward Hertz, Jay A. Bookbinder, Ramses Günther, Alex Yanson, Giuseppe Vacanti, and Marcelo D. Ackermann "Performance testing of an off-plane reflection grating and silicon pore optic spectrograph at PANTER," Journal of Astronomical Telescopes, Instruments, and Systems 1(4), 045004 (22 December 2015). https://doi.org/10.1117/1.JATIS.1.4.045004
Published: 22 December 2015
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Cited by 4 scholarly publications.
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KEYWORDS
Spectrographs
Diffraction gratings
Silicon
Sensors
X-rays
Charge-coupled devices
Astronomical imaging
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