Dr. Ajay Kumar Saxena
Head, Photonics Div at Indian Institute of Astrophysics
SPIE Involvement:
Author
Publications (10)

SPIE Journal Paper | 1 December 2010
Lancelot Paul, Ajay Saxena
OE, Vol. 49, Issue 12, 126601, (December 2010) https://doi.org/10.1117/12.10.1117/1.3518068
KEYWORDS: Wavefronts, Wavefront sensors, Sensors, Adaptive optics, Interferometry, Zernike polynomials, Monochromatic aberrations, Optical engineering, Atmospheric optics, Interferometers

Proceedings Article | 1 November 1997 Paper
Ajay Saxena, Ramnath Cowsik
Proceedings Volume 3152, (1997) https://doi.org/10.1117/12.279375
KEYWORDS: Mirrors, Monochromators, Polishing, Zerodur, Vacuum ultraviolet, Extreme ultraviolet, Synchrotron technology, Synchrotrons, Astrophysics, Silica

Proceedings Article | 15 October 1997 Paper
J. Gethyn Timothy, Paolo Bergamini, Jagadish Bhattacharyya, Martin Huber, Surendra Jain, Giampiero Naletto, Ralph Nicholls, Piergiorgio Nicolosi, Ajay Saxena, Giuseppe Tondello, Arthur Walker
Proceedings Volume 3114, (1997) https://doi.org/10.1117/12.290135
KEYWORDS: Extreme ultraviolet, Telescopes, Mirrors, Sensors, Space telescopes, Spectroscopy, Imaging systems, Spatial resolution, Diffraction gratings, Calibration

Proceedings Article | 10 December 1993 Paper
Ajay Saxena, J. Lancelot, J. Samson
Proceedings Volume 2003, (1993) https://doi.org/10.1117/12.165442
KEYWORDS: Mirrors, Wavefronts, Telescopes, Active optics, Adaptive optics, Interferometry, Monochromatic aberrations, Wavefront sensors, Polarization, Sensors

Proceedings Article | 22 January 1993 Paper
Thomas Berger, Paolo Bergamini, Arthur Walker, J. Gethyn Timothy, Surendra Jain, Ajay Saxena, Jagadish Bhattacharyya, Martin Huber, Giuseppe Tondello, Giampiero Naletto, Phillip Baker
Proceedings Volume 1764, (1993) https://doi.org/10.1117/12.140849
KEYWORDS: Diffraction gratings, Extreme ultraviolet, Spectrographs, Sensors, Lamps, Ultraviolet radiation, Telescopes, Rockets, Spectral resolution, Spherical lenses

Showing 5 of 10 publications
Conference Committee Involvement (2)
Advances in Metrology for X-Ray and EUV Optics IV
12 August 2012 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics III
1 August 2010 | San Diego, California, United States
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