Dr. Frédéric Girard Profile

Dr. Frédéric Girard

at CEA-DAM Ile-de-France

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 3 October 2022 Presentation + Paper

Automated real-time optical detection system used for laser alignment analysis

F. Girard

Proceedings Volume 12222, 1222209 (2022) https://doi.org/10.1117/12.2636017

KEYWORDS: Calibration, Zoom lenses, X-rays, Tablets, Cameras, Optical alignment, Laser systems engineering, Eye, Visualization, Image analysis

Read Abstract +

Proceedings Article | 15 October 2012 Paper

High resolution imaging systems for inertial confinement fusion experiments

D. Dennetiere, P. Audebert, R. Bahr, S. Bole, J. L. Bourgade, B. Brannon, F. Girard, G. Pien, Ph. Troussel

Proceedings Volume 8505, 85050G (2012) https://doi.org/10.1117/12.929490

KEYWORDS: Mirrors, Diagnostics, Reflectivity, X-rays, Image resolution, Imaging systems, Microscopes, Fusion energy, Multilayers, X-ray imaging

Read Abstract +

Proceedings Article | 7 January 2004 Paper

Measurement of the time-resolved x-ray emission of different elements irradiated with a subpicosecond high-power laser

Claude Chenais-Popovics, Patrick Audebert, Virginie Nagels, Jean-Paul Geindre, Jean-Claude Gauthier, Sylvie Gary, Frederic Girard, Fabien Dorchies, Ronnie Shepherd, Olivier Peyrusse

Proceedings Volume 5196, (2004) https://doi.org/10.1117/12.507071

KEYWORDS: Plasma, X-rays, Aluminum, Picosecond phenomena, Samarium, Selenium, Streak cameras, Crystals, Interferometry, Spectroscopy

Read Abstract +

Proceedings Article | 7 January 2004 Paper

Multi-keV x-ray conversion from prepulsed foil experiments

Frederic Girard, Jean-Paul Jadaud, Michel Naudy, Bruno Villette, Daniele Babonneau, Michel Primout, Sylvie Depierreux, Michael Miller, Robert Kauffman, Laurence Suter, Kevin Fournier, S. Glenzer, Christina Back, Jacob Grun, John Davis

Proceedings Volume 5196, (2004) https://doi.org/10.1117/12.510010

KEYWORDS: X-rays, Plasma, Titanium, Diagnostics, Pulsed laser operation, Spectrometers, Thomson scattering, Copper, Optical simulations, X-ray sources

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years