Prof. Glenn H. Chapman Profile

Prof. Glenn H. Chapman

Professor Engineering Science at Simon Fraser Univ

SPIE Involvement:

Author

Publications (94)

Proceedings Article | 12 March 2024 Presentation + Paper

Fast scattering coefficient measurement of intralipid-infused tissue phantoms using imaging sensors

Glenn Chapman, Isabella Aguilera, Matthew Schilling

Proceedings Volume 12840, 1284002 (2024) https://doi.org/10.1117/12.3003941

KEYWORDS: Scattering, Laser scattering, Cameras, Tissues, Solids, Scatter measurement, Light scattering, 3D printing, Anisotropy, Polymethylmethacrylate

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Proceedings Article | 11 March 2024 Presentation + Paper

Sum of integrated emissions detecting ammonia from 1 to 10,000 PPM using 405 nm induced fluorescence of vapochromic coordination polymers

Glenn Chapman, Xin Wei, Bonnie Gray, Daniel Leznoff, Dawei Yin, Leanna Karn

Proceedings Volume 12893, 128930Q (2024) https://doi.org/10.1117/12.3003945

KEYWORDS: Fluorescence, Polymers, Spectroscopy, Fluorescence intensity, Sensors, Semiconductor lasers, Ultraviolet radiation, Fluorescence spectroscopy, Emission wavelengths, Light emitting diodes

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Proceedings Article | 8 March 2023 Presentation + Paper

Enhancing detecting ammonia from 1 to 10,000’s PPM using laser-induced fluorescence of tuned vapochromic coordination polymers

Glenn Chapman, Viraj Patel, Bonnie Gray, Daniel Leznoff, Dawei Yin

Proceedings Volume 12428, 124280J (2023) https://doi.org/10.1117/12.2651067

KEYWORDS: Fluorescence, Polymers, Sensors, Spectroscopy, Semiconductor lasers, Fluorescence spectroscopy, Fluorescence intensity, Light emitting diodes, Ultraviolet radiation, Transformers

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The detection of ammonia and similar gases over a wide range from a few Parts Per Millions (ppm) to 10,000’s ppm in a single sensor is important for industrial applications. We are exploring Vapochromic Coordination Polymers (VCP) specifically Zn[Au(CN)₂]₂, developed to achieve fluorescence when exposed to NH3. At high concentration of ammonia under UV stimulation VCP spectrally shifts its fluorescent peak from 470nm to 530nm while the intensity grows 3~5X. We use a 405nm laser diode excitation source which provides a narrow (4nm) stimulation clearly separated from the spectral peak. Focusing the emission on a USB portable spectrometer (430 to 700nm) at concentrations <1000 ppm of ammonia there is almost no peak wavelength spectral shift or intensity change and only subtle fluorescent spectrum alterations. To detect first we create a method that gives unique values over the range 1- <1000 ppm by dividing the spectrum into 10 nm bins, integrate the emission in each bin, relative to that of 0 ppm exposure, then sum all the bins (Sum of Integrated Emissions, SIE). The key analysis point is to note that the way the spectrum changes in each wavelength bin varies at different ammonia ppm exposures. SIE gives excellent sensitivity between 0-50 ppm and <400 ppm, but poor accuracy in the 100-500ppm range. Using the SIE to identify measurements in that region we switch to a second metric, Limited Range SIE, that covers only the 430-470nm bins but for 100-500ppm gives an accurate linear response. This shows that in many spectral fluorescence cases in the region where the longer wavelength peak begins to dominate looking at regions outside of the peak maximas is more accurate than including those within the unexposed to saturated exposure (eg ammonia) peak range. By creating a model assuming the fraction z of 0ppm and saturated spectrum are linearly combined we fit the measured spectrum using regression analysis to obtain the z value for all ppm measurements which show what is going on in the VCP conversion.

Proceedings Article | 5 March 2021 Presentation + Paper

Detecting PPM ammonia over wide range using laser induced fluorescence of vapochromic coordination polymers

Glenn Chapman, Dawei Yin, Bonnie Gray, Daniel Leznoff

Proceedings Volume 11693, 116930W (2021) https://doi.org/10.1117/12.2584207

KEYWORDS: Polymers, Laser induced fluorescence, Spectroscopy, Sensors, Semiconductor lasers, Near ultraviolet, Luminescence

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Proceedings Article | 25 February 2020 Presentation + Paper

Characterizing long lived intralipid-infused tissue phantoms scattering using imaging sensors

Yutian Zhang, Glenn Chapman, Sean Paulsen

Proceedings Volume 11238, 112380S (2020) https://doi.org/10.1117/12.2548689

KEYWORDS: Scattering, Laser scattering, Light scattering, Solids, Cameras, Tissue optics, Tissues, Scatter measurement, Anisotropy, Polymethylmethacrylate

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Proceedings Article | 4 March 2019 Presentation

Long lived intralipid-infused tissue phantoms: control and characterization of scattering characteristics (Conference Presentation)

Glenn Chapman, Magda Sanchez

Proceedings Volume 10876, 108760E (2019) https://doi.org/10.1117/12.2511052

KEYWORDS: Scattering, Tissue optics, Tissues, Light scattering, Laser scattering, Optical testing, Biomedical optics, Anisotropy, Skin, Polymers

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Proceedings Article | 14 March 2018 Presentation

Fabricating and characterizing long lived tissue phantoms using intralipid-infused solids

Glenn Chapman, Peter Le

Proceedings Volume 10492, 104920N (2018) https://doi.org/10.1117/12.2291414

KEYWORDS: Scattering, Tissue optics, Light scattering, Laser scattering, Tissues, Biomedical optics, Scatter measurement, Image analysis, Optical fabrication, Solids

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Proceedings Article | 22 February 2018 Presentation + Paper

Detection of low-concentration ammonia using differential laser-induced fluorescence on vapochromic coordination polymers

Dawei Yin, Glenn Chapman, Daniel Leznoff, Bonnie Gray, David Stevens

Proceedings Volume 10539, 105390K (2018) https://doi.org/10.1117/12.2285686

KEYWORDS: Polymers, Sensors, Luminescence, Spectroscopy, Laser induced fluorescence, Semiconductor lasers, Calibration, Gases, Nitrogen, Spectral data processing

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Proceedings Article | 18 March 2016 Presentation + Paper

Enhancing defect tolerance in periodic post microfluidic channels

Glenn Chapman, Bonnie Gray

Proceedings Volume 9705, 97050M (2016) https://doi.org/10.1117/12.2223451

KEYWORDS: Microfluidics, Particles, Monte Carlo methods, Modeling, Tolerancing, Statistical modeling, Fluid dynamics, Biomedical optics, Sensors, Mathematics, Protactinium, Photomasks, Computer simulations, 3D modeling, Silicon

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Proceedings Article | 24 March 2015 Paper

Modeling defect tolerance sensitivity to periodic post parameters in microfluidic channels

Mahyar Mehran, Bonnie Gray, Glenn Chapman

Proceedings Volume 9320, 93200B (2015) https://doi.org/10.1117/12.2080870

KEYWORDS: Microfluidics, Particles, Monte Carlo methods, Tolerancing, 3D modeling, MATLAB, Protactinium, Fluid dynamics, Computer simulations, Systems modeling

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Proceedings Article | 13 March 2015 Paper

Enhanced correction methods for high density hot pixel defects in digital imagers

Zahava Koren, Glenn Chapman, Rahul Thomas, Rohit Thomas, Israel Koren

Proceedings Volume 9403, 94030T (2015) https://doi.org/10.1117/12.2083147

KEYWORDS: Imaging systems, Cameras, Sensors, Standards development, CCD image sensors, Curium, Ions, Calibration, Algorithm development, Neodymium

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Proceedings Article | 7 March 2014 Paper

Calibrating bimetallic grayscale photomasks to photoresist response for precise micro-optics fabrication

Glenn Chapman, Reza Qarehbaghi, Santiago Roche

Proceedings Volume 8973, 897307 (2014) https://doi.org/10.1117/12.2041429

KEYWORDS: Photomasks, Transparency, Photoresist materials, Calibration, Photoresist processing, Micro optics, Optical lithography, Glasses, Sensors, Absorbance

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Proceedings Article | 6 March 2014 Paper

Modeling particle flow and blockages in microfluidic channels supported by periodic posts

Mahyar Mehran, Jorden Bryer, Bonnie Gray, Glenn Chapman

Proceedings Volume 8976, 897604 (2014) https://doi.org/10.1117/12.2040612

KEYWORDS: Microfluidics, Particles, Monte Carlo methods, MATLAB, Systems modeling, 3D modeling, Sensors, Statistical analysis, Tolerancing, Statistical modeling

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Proceedings Article | 4 March 2014 Paper

Correcting high-density hot pixel defects in digital imagers

Glenn Chapman, Rohit Thomas, Israel Koren, Zahava Koren

Proceedings Volume 9022, 90220G (2014) https://doi.org/10.1117/12.2041388

KEYWORDS: Cameras, Sensors, Imaging systems, CCD image sensors, Curium, Image quality, Standards development, Data modeling, Photography, Calibration

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Proceedings Article | 19 February 2013 Paper

Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISO

Glenn Chapman, Rohit Thomas, Zahava Koren, Israel Koren

Proceedings Volume 8659, 86590C (2013) https://doi.org/10.1117/12.2005850

KEYWORDS: Cameras, Sensors, CCD image sensors, Charge-coupled devices, Cell phones, CCD cameras, Imaging systems, Calibration, Image sensors, Standards development

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Proceedings Article | 8 November 2012 Paper

Bimetallic grayscale photomasks for micro-optics fabrication using dual wavelength laser writing techniques

Reza Qarehbaghi, Glenn Chapman

Proceedings Volume 8522, 85222K (2012) https://doi.org/10.1117/12.977189

KEYWORDS: Photomasks, Argon ion lasers, Sensors, Beam shaping, Modulation, Camera shutters, Micro optics, Optical filters, Binary data, Photoresist materials

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Proceedings Article | 7 March 2012 Paper

Incoherent source angular domain imaging through complex three-dimensional scattering structures

Glenn Chapman, Rongen L. Cheng, Gary Chiang

Proceedings Volume 8221, 82211J (2012) https://doi.org/10.1117/12.909475

KEYWORDS: Scattering, Light scattering, Photons, Laser scattering, Light emitting diodes, 3D image processing, Image quality, Optical filters, Image filtering, 3D acquisition

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Proceedings Article | 7 March 2012 Paper

Fluorescence angular domain imaging of skin tissue phantoms using intralipid-infused solids

Michael Phang, Rongen L. Cheng, Nick Pfeiffer, Glenn Chapman, Rahul Thomas, Bozena Kaminska

Proceedings Volume 8221, 822119 (2012) https://doi.org/10.1117/12.909471

KEYWORDS: Scattering, Luminescence, Solids, Tissues, Light scattering, Skin, Photons, Collagen, Tissue optics, Image filtering

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Proceedings Article | 18 February 2012 Paper

Bimetallic grayscale photomasks written using flat-top beam vs. Gaussian beam

Waris Boonyasiriwat, Glenn Chapman, Reza Qarehbaghi

Proceedings Volume 8243, 824305 (2012) https://doi.org/10.1117/12.909543

KEYWORDS: Photomasks, Beam shaping, Sensors, Transparency, Gaussian beams, Binary data, Glasses, Prisms, Digital imaging, Thin films

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Proceedings Article | 15 February 2012 Paper

Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO

Jenny Leung, Israel Koren, Zahava Koren, Glenn Chapman, Ana Namburete, Rohit Thomas

Proceedings Volume 8298, 82980E (2012) https://doi.org/10.1117/12.910096

KEYWORDS: Cameras, Sensors, CCD image sensors, Charge-coupled devices, CCD cameras, Imaging systems, Calibration, Picosecond phenomena, Image sensors, Control systems

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Proceedings Article | 14 October 2011 Paper

Improving the accuracy of the bimetallic grayscale photomasks using a feedback controlled flat-top beam

Glenn Chapman, Waris Boonyasiriwat, Reza Qarehbaghi

Proceedings Volume 8166, 816641 (2011) https://doi.org/10.1117/12.898905

KEYWORDS: Photomasks, Beam shaping, Transparency, Raster graphics, Objectives, Optical lithography, Photoresist materials, Sensors, Transmittance, Binary data

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Proceedings Article | 2 March 2011 Paper

Optical imaging through non-transparent small aquatic creatures with angular-domain imaging

Polly B. Tsui, Rongen L. Cheng, Glenn Chapman, Gary Chiang

Proceedings Volume 7897, 78971X (2011) https://doi.org/10.1117/12.876232

KEYWORDS: Photons, Scattering, Light scattering, Light sources, Imaging systems, Laser scattering, Nd:YAG lasers, Semiconductor lasers, Optical filters, Image sensors

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Proceedings Article | 2 March 2011 Paper

Angular-domain imaging of fluorescence sources within tissue phantoms

Polly Tsui, Nick Pfeiffer, Reza Qarehbaghi, Rongen L. Cheng, Glenn Chapman

Proceedings Volume 7897, 78970W (2011) https://doi.org/10.1117/12.875675

KEYWORDS: Scattering, Collimators, Luminescence, Photons, Monte Carlo methods, Tissues, Chromium, Light scattering, Image filtering, Imaging systems

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Proceedings Article | 17 February 2011 Paper

Tradeoffs in imager design parameters for sensor reliability

Jenny Leung, Israel Koren, Zahava Koren, Rahul Thomas, Glenn Chapman

Proceedings Volume 7875, 78750I (2011) https://doi.org/10.1117/12.876947

KEYWORDS: Cameras, Sensors, CCD image sensors, CCD cameras, Calibration, Imaging systems, Image sensors, Photography, Picosecond phenomena, Reliability

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Proceedings Article | 17 February 2011 Paper

Simulating enhanced photo carrier collection in the multifinger photogate active pixel sensors

Ash Parameswaran, Glenn Chapman, Phanindra Kalyanam

Proceedings Volume 7875, 787508 (2011) https://doi.org/10.1117/12.876767

KEYWORDS: Device simulation, Absorption, Standards development, Sensors, Active sensors, Computer simulations, CMOS technology, CMOS sensors, TCAD, Photodiodes

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Proceedings Article | 14 February 2011 Paper

Bimetallic grayscale photomasks written using optical density feedback control

Reza Qarehbaghi, James Dykes, Glenn Chapman

Proceedings Volume 7927, 792719 (2011) https://doi.org/10.1117/12.876234

KEYWORDS: Photomasks, Transparency, Raster graphics, Feedback control, Sensors, Optical lithography, Objectives, Thin films, Argon ion lasers, Absorbance

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SPIE Journal Paper | 1 November 2010 Open Access

Angular domain transillumination imaging optimization with an ultrafast gated camera

Fartash Vasefi, Mohamadreza Najiminaini, Eldon Ng, Bozena Kaminska, Glenn Chapman, Jeffrey Carson

JBO, Vol. 15, Issue 06, 061710, (November 2010) https://doi.org/10.1117/12.10.1117/1.3505020

KEYWORDS: Photons, Scattering, Light scattering, Cameras, Imaging systems, Chromium, Tissue optics, Sensors, Pulsed laser operation, Reflection

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Proceedings Article | 22 March 2010 Paper

Angle-resolved spectroscopy using a radial angular filter array

Mohamadreza Najiminaini, Jeffrey Carson, Haishan Zeng, Eldon Ng, Bozena Kaminska, Fartash Vasefi, Glenn Chapman

Proceedings Volume 7562, 756209 (2010) https://doi.org/10.1117/12.841548

KEYWORDS: Spectroscopy, Collimation, Optical filters, Light scattering, Light sources, Diffusers, Tissue optics, Silicon, Scattering, Imaging systems

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Proceedings Article | 18 March 2010 Paper

Angular domain spectroscopic imaging of turbid media using silicon micromachined microchannel arrays

Fartash Vasefi, Mohamadreza Najiminaini, Genevieve Albert, Glenn Chapman, Jeffrey J. Carson, Eldon Ng, Bozena Kaminska

Proceedings Volume 7568, 75681K (2010) https://doi.org/10.1117/12.841493

KEYWORDS: Tissues, Photons, Spectroscopy, Image filtering, Imaging systems, Light scattering, Hyperspectral imaging, Optical filters, Tissue optics, Imaging spectroscopy

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Proceedings Article | 24 February 2010 Paper

Contrast and resolution analysis of angular domain imaging for iterative optical projection tomography reconstruction

Jeffrey Carson, Eldon Ng, Glenn Chapman, Fartash Vasefi, Bozena Kaminska

Proceedings Volume 7557, 755714 (2010) https://doi.org/10.1117/12.843099

KEYWORDS: Reconstruction algorithms, Photons, Image resolution, Image filtering, Optical filters, Detection and tracking algorithms, Optical imaging, Tomography, Imaging systems, Signal attenuation

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Proceedings Article | 23 February 2010 Paper

Optical imaging of structures within highly scattering material using an incoherent beam and a spatial filter

Bozena Kaminska, Glenn Chapman, Nick Pfeiffer

Proceedings Volume 7562, 756208 (2010) https://doi.org/10.1117/12.843286

KEYWORDS: Photons, Scattering, Monte Carlo methods, Laser scattering, Spatial filters, Optical filters, Image filtering, Collimation, Tissue optics, Point spread functions

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Proceedings Article | 23 February 2010 Paper

Spatiofrequency filters for imaging fluorescence in scattering media

Bozena Kaminska, Gary Chiang, Rongen L. Cheng, Glenn Chapman, Nick Pfeiffer, Polly Tsui

Proceedings Volume 7562, 75620B (2010) https://doi.org/10.1117/12.842998

KEYWORDS: Scattering, Photons, Luminescence, Monte Carlo methods, Cameras, Image filtering, Light scattering, Image resolution, Optical filters, Tissues

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Proceedings Article | 18 February 2010 Paper

Defect tolerance in microfluidic chambers for capacitive biosensors

Bonnie Gray, Vijay Jain, Glenn Chapman

Proceedings Volume 7593, 75930V (2010) https://doi.org/10.1117/12.845388

KEYWORDS: Microfluidics, Particles, Sensors, Electronics, Electrodes, Protactinium, Capacitance, Tolerancing, Biosensors, Biomedical optics

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Proceedings Article | 26 January 2010 Paper

Analyzing the impact of ISO on digital imager defects with an automatic defect trace algorithm

Glenn Chapman, Jenny Leung, Rohit Thomas, Israel Koren, Yong Choi, Zahava Koren

Proceedings Volume 7536, 75360F (2010) https://doi.org/10.1117/12.839156

KEYWORDS: Cameras, Sensors, Calibration, CCD cameras, Imaging systems, Photography, CCD image sensors, Defect detection, Algorithm development, Image sensors

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Proceedings Article | 26 January 2010 Paper

Enhanced sensitivity achievement using advanced device simulation of multifinger photo gate active pixel sensors

Ash Parameswaran, Glenn Chapman, Phanindra V. R. Kalyanam

Proceedings Volume 7536, 75360G (2010) https://doi.org/10.1117/12.839157

KEYWORDS: Sensors, Active sensors, Silicon, Device simulation, Computer simulations, Standards development, Transistors, Absorption, Molybdenum, CMOS sensors

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SPIE Journal Paper | 1 January 2010 Open Access

Angular domain fluorescence imaging for small animal research

Fartash Vasefi, Michelle Belton, Bozena Kaminska, Glenn Chapman, Jeffrey Carson

JBO, Vol. 15, Issue 01, 016023, (January 2010) https://doi.org/10.1117/12.10.1117/1.3281670

KEYWORDS: Imaging systems, Luminescence, Preclinical imaging, Tissues, Photons, Medical research, Spatial resolution, X-ray computed tomography, Image filtering, Cameras

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Proceedings Article | 23 September 2009 Paper

Enhanced laser-writing techniques for bimetallic grayscale photomasks

Glenn Chapman, James Dykes

Proceedings Volume 7488, 74880O (2009) https://doi.org/10.1117/12.829743

KEYWORDS: Sensors, Photomasks, Calibration, Optical lithography, Argon ion lasers, Thin films, Sputter deposition, Indium, Optical filters, Glasses

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Proceedings Article | 10 July 2009 Paper

Angular domain optical imaging of turbid media using enhanced micro-tunnel filter arrays

Benny Hung, Bozena Kaminska, Glenn Chapman, Jeffrey Carson, Fartash Vasefi

Proceedings Volume 7369, 73691N (2009) https://doi.org/10.1117/12.831644

KEYWORDS: Optical filters, Photons, Light scattering, Image filtering, Scattering, Reflection, Sensors, Silicon, Optical imaging, Imaging systems

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Proceedings Article | 25 February 2009 Paper

Angular domain fluorescent lifetime imaging in turbid media

Fartash Vasefi, Glenn Chapman, Jeffrey J. Carson, Eldon Ng, Bozena Kaminska

Proceedings Volume 7183, 71830I (2009) https://doi.org/10.1117/12.809458

KEYWORDS: Photons, Optical filters, Luminescence, Picosecond phenomena, Cameras, Light scattering, Pulsed laser operation, Scattering, Tissues, Laser sources

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Proceedings Article | 25 February 2009 Paper

Angular distribution of quasi-ballistic light measured through turbid media using angular domain optical imaging

Jeffrey J. Carson, Bozena Kaminska, Glenn Chapman, Fartash Vasefi

Proceedings Volume 7175, 717509 (2009) https://doi.org/10.1117/12.809356

KEYWORDS: Photons, Light scattering, Scattering, Tissue optics, Light, Semiconductor lasers, Image filtering, Optical filters, Silicon, Spatial resolution

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Proceedings Article | 25 February 2009 Paper

Spatiofrequency filter in turbid medium enhanced by background scattered light subtraction from a deviated laser source

Nick Pfeiffer, Bozena Kaminska, Fartash Vasefi, Glenn Chapman, Polly B. Tsui, Rongen L. Cheng

Proceedings Volume 7175, 71750A (2009) https://doi.org/10.1117/12.809592

KEYWORDS: Light scattering, Image enhancement, Photons, Optical filters, Scattering, Image filtering, Linear filtering, Prisms, Laser scattering, Light

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Proceedings Article | 24 February 2009 Paper

Optical characterization of the mask writing process in bimetallic grayscale photomasks

Glenn Chapman, James Dykes

Proceedings Volume 7201, 72010S (2009) https://doi.org/10.1117/12.809975

KEYWORDS: Photomasks, Indium, Calibration, Optical lithography, Bismuth, Sputter deposition, Tin, Sensors, Thin films, Optical filters

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Proceedings Article | 24 February 2009 Paper

Image contrast enhancement during time-angular domain imaging through turbid media by estimation of background scattered light

Jeffrey J. Carson, Glenn Chapman, Fartash Vasefi, Bozena Kaminska, Eldon Ng

Proceedings Volume 7182, 71821C (2009) https://doi.org/10.1117/12.810091

KEYWORDS: Photons, Image enhancement, Microchannel plates, Cameras, Picosecond phenomena, Light scattering, Scattering, Image contrast enhancement, Optical filters, Collimation

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Proceedings Article | 24 February 2009 Paper

Effect of time gating and polarization discrimination of propagating light in turbid media during angular domain imaging (ADI)

Jeffrey J. Carson, Eldon Ng, Bozena Kaminska, Glenn Chapman, Fartash Vasefi

Proceedings Volume 7182, 718217 (2009) https://doi.org/10.1117/12.809439

KEYWORDS: Photons, Polarization, Scattering, Light scattering, Optical filters, Cameras, Tissues, Laser scattering, Pulsed laser operation, Picosecond phenomena

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Proceedings Article | 24 February 2009 Paper

Angular domain optical projection tomography in turbid media

Kevin Jordan, Jeffrey J. Carson, Fartash Vasefi, Glenn Chapman, Bozena Kaminska

Proceedings Volume 7174, 71740D (2009) https://doi.org/10.1117/12.809394

KEYWORDS: Light scattering, Scattering, Tomography, Photons, Optical tomography, Laser scattering, Projection systems, Semiconductor lasers, Imaging systems, Optical filters

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Proceedings Article | 28 January 2009 Paper

The implementation and spectrum response analysis of multifinger photogate APS pixels

Glenn Chapman, M. Parameswaran, Michelle La Haye, Jeff Liu, Jenny Leung, Phanindra Kalyanam

Proceedings Volume 7249, 724903 (2009) https://doi.org/10.1117/12.806110

KEYWORDS: Absorption, Light emitting diodes, Silicon, Sensors, Calibration, Quantum efficiency, Transistors, Molybdenum, Capacitors, CMOS sensors

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Proceedings Article | 19 January 2009 Paper

Statistical identification and analysis of defect development in digital imagers

Israel Koren, Zahava Koren, Glenn Chapman, Jenny Leung

Proceedings Volume 7250, 72500W (2009) https://doi.org/10.1117/12.806109

KEYWORDS: Cameras, Sensors, Detection and tracking algorithms, Defect detection, Optical inspection, Imaging systems, CCD image sensors, Image sensors, Statistical analysis, Error analysis

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Proceedings Article | 17 October 2008 Paper

Effects of heated substrates on bimetallic thermal resist for lithography and grayscale photomask applications

Jenny Leung, James Dykes, Polly Tsui, Glenn Chapman

Proceedings Volume 7122, 71220M (2008) https://doi.org/10.1117/12.801560

KEYWORDS: Argon ion lasers, Photomasks, Laser systems engineering, Nd:YAG lasers, Transparency, Laser development, Objectives, Thin films, Sensors, Calibration

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Proceedings Article | 19 March 2008 Paper

Characterization of pixel defect development during digital imager lifetime

Zahava Koren, Glenn Chapman, Israel Koren, Jozsef Dudas, Jenny Leung

Proceedings Volume 6816, 68160A (2008) https://doi.org/10.1117/12.767011

KEYWORDS: Sensors, Cameras, Detection and tracking algorithms, Imaging systems, Algorithm development, Calibration, Image processing, Computer simulations, Error analysis, Statistical analysis

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Proceedings Article | 5 March 2008 Paper

Enhanced angular domain optical imaging by background scattered light subtraction from a deviated laser source

Bozena Kaminska, Paulman Chan, Nick Pfeiffer, Fartash Vasefi, Glenn Chapman

Proceedings Volume 6854, 68541E (2008) https://doi.org/10.1117/12.764651

KEYWORDS: Image enhancement, Light scattering, Digital signal processing, Scattering, Photons, Laser scattering, Optical filters, Light, Image filtering, Image processing

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Proceedings Article | 20 February 2008 Paper

Optical imaging of structures within highly scattering material using a lens and aperture to form a spatiofrequency filter

Bozena Kaminska, Paulman Chan, Fartash Vasefi, Glenn Chapman, Nick Pfeiffer

Proceedings Volume 6854, 68541D (2008) https://doi.org/10.1117/12.764341

KEYWORDS: Scattering, Photons, Image resolution, Optical filters, Image filtering, Light scattering, Image sensors, Laser scattering, Tissue optics, Linear filtering

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Proceedings Article | 6 February 2008 Paper

Enhancing direct-write laser control techniques for bimetallic grayscale photomasks

James Dykes, Glenn Chapman, Calin Plesa

Proceedings Volume 6883, 688312 (2008) https://doi.org/10.1117/12.765006

KEYWORDS: Photomasks, Cameras, Transparency, Profilometers, Sensors, Optical lithography, Camera shutters, Electro optics, Argon ion lasers, Calibration

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Proceedings Article | 1 November 2007 Paper

Bimetallic thermal resists potential for double-exposure immersion lithography and grayscale photomasks

Glenn Chapman, Calin Plesa, Chinheng Choo, James Dykes

Proceedings Volume 6730, 673040 (2007) https://doi.org/10.1117/12.746990

KEYWORDS: Photomasks, Transparency, Sensors, Immersion lithography, Optical lithography, Argon ion lasers, Calibration, Thin films, Lithography, Photodiodes

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Proceedings Article | 13 March 2007 Paper

Improving the optical characteristics of bimetallic grayscale photomasks

Jun Wang, Jimmy Tsui, Glenn Chapman, David Poon, James Dykes

Proceedings Volume 6458, 64580T (2007) https://doi.org/10.1117/12.702589

KEYWORDS: Photomasks, Argon ion lasers, Thin films, Binary data, Cameras, Raster graphics, Glasses, Video, Optical filters, CCD cameras

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Proceedings Article | 20 February 2007 Paper

Identification of in-field defect development in digital image sensors

Israel Koren, Zahava Koren, Cory Jung, Linda Wu, Jozsef Dudas, Glenn Chapman

Proceedings Volume 6502, 65020Y (2007) https://doi.org/10.1117/12.704563

KEYWORDS: Cameras, Sensors, Calibration, Photography, Imaging systems, Image sensors, Manufacturing, Digital cameras, CCD image sensors, CMOS sensors

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Proceedings Article | 6 February 2007 Paper

Multispectral angular domain optical tomography in scattering media with argon and diode laser sources

Bozena Kaminska, Paulman Chan, Glenn Chapman, Fartash Vasefi, Nick Pfeiffer

Proceedings Volume 6435, 64350M (2007) https://doi.org/10.1117/12.701813

KEYWORDS: Semiconductor lasers, Scattering, Light scattering, Tissues, Laser scattering, Image filtering, Argon ion lasers, Optical filters, Collimation, Silicon

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Proceedings Article | 22 January 2007 Paper

Creation of embedded structures in SU-8

Bonnie Gray, Jun Wang, James Dykes, Dan Sameoto, Glenn Chapman, David Poon, Chinheng Choo, Jimmy T. K. Tsui, Ash Parameswaren

Proceedings Volume 6465, 64650N (2007) https://doi.org/10.1117/12.702876

KEYWORDS: Photomasks, Ultraviolet radiation, Semiconducting wafers, Quartz, Bridges, Glasses, Scanning electron microscopy, Microscopes, Binary data, Photoresist materials

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Proceedings Article | 24 October 2006 Paper

Deep illumination angular domain imaging within highly scattering media enhanced by image processing

Paulman Chan, Glenn Chapman, Bozena Kaminska, Fartash Vasefi

Proceedings Volume 6380, 63800Q (2006) https://doi.org/10.1117/12.686428

KEYWORDS: Light scattering, Scattering, Image processing, Photons, Image enhancement, Optical filters, Silicon, Laser scattering, Tissue optics, Image filtering

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Proceedings Article | 20 October 2006 Paper

Adding grayscale layer to chrome photomasks

James Dykes, Jun Wang, Patrick Reynolds, Chinheng Choo, Andrew Zanzal, Jimmy T. Tsui, David Poon, Yuqiang Tu, Glenn Chapman

Proceedings Volume 6349, 634931 (2006) https://doi.org/10.1117/12.686599

KEYWORDS: Photomasks, Argon ion lasers, Binary data, Photoresist materials, Reticles, Optical lithography, Thin films, Calibration, Glasses, Oxidation

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Proceedings Article | 29 March 2006 Paper

Laser-induced oxidation of metallic thin films as a method for creating grayscale photomasks

Jun Wang, David Poon, Glenn Chapman, Chinheng Choo, Yuqiang Tu, Marian Chang

Proceedings Volume 6153, 61534G (2006) https://doi.org/10.1117/12.657067

KEYWORDS: Photomasks, Thin films, Photoresist materials, Argon ion lasers, Metals, Lithography, Beam splitters, Radium, Raster graphics, Oxidation

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Proceedings Article | 1 March 2006 Paper

Real-time optical characterization of laser oxidation process in bimetallic direct write gray scale photomasks

Marian Chang, Yuqiang Tu, Glenn Chapman, Chinheng Choo, Jun Wang, David Poon

Proceedings Volume 6106, 61060G (2006) https://doi.org/10.1117/12.647251

KEYWORDS: Photodiodes, Absorbance, Thin films, Diodes, Photovoltaics, Camera shutters, Optical filters, Argon ion lasers, Photomasks, Oxidation

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Proceedings Article | 1 March 2006 Paper

Laser-induced oxidation of Zn and Zn alloy films for direct-write grayscale photomasks

Yuqiang Tu, Chinheng Choo, Marian Chang, Jun Wang, Glenn Chapman, David Poon, Jun Peng

Proceedings Volume 6106, 61060F (2006) https://doi.org/10.1117/12.648618

KEYWORDS: Zinc, Photomasks, Argon ion lasers, Glasses, Zinc oxide, Objectives, Raster graphics, Modulation, Oxides, Oxidation

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Proceedings Article | 1 March 2006 Paper

Enhanced angular domain imaging in turbid media using Gaussian line illumination

Nick Pfeiffer, Josna Rao, Fartash Vasefi, Paulman K. Y. Chan, Bozena Kaminska, Glenn Chapman, Ted C. K. Liu

Proceedings Volume 6084, 60841D (2006) https://doi.org/10.1117/12.650457

KEYWORDS: Scattering, Light scattering, Collimators, Laser scattering, Photons, Carbon, Silicon, Beam expanders, Tissue optics, Sensors

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Proceedings Article | 6 February 2006 Paper

Noise analysis of fault tolerant active pixel sensors with and without defects

Mohammad Izadi, Karim Karim, Michelle La Haye, Glenn Chapman, Cory Jung

Proceedings Volume 6068, 606804 (2006) https://doi.org/10.1117/12.643453

KEYWORDS: Transistors, Signal to noise ratio, Amplifiers, Photodiodes, Sensors, Interference (communication), Active sensors, Imaging systems, Resistors, Standards development

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Proceedings Article | 17 January 2006 Paper

Robust detection of defects in imaging arrays

Glenn Chapman, Israel Koren, Zahava Koren, Jozsef Dudas, Cory Jung

Proceedings Volume 6059, 60590X (2006) https://doi.org/10.1117/12.643452

KEYWORDS: Imaging systems, Sensors, Error analysis, Defect detection, Imaging arrays, Calibration, Image processing, Manufacturing, Monte Carlo methods, Computer simulations

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Proceedings Article | 4 November 2005 Paper

Expanding grayscale capability of direct-write grayscale photomask by using modified Bi/In compositions

David Poon, Yuqiang Tu, Chinheng Choo, Jun Wang, Glenn Chapman, Michelle La Haye

Proceedings Volume 5992, 59920K (2005) https://doi.org/10.1117/12.632245

KEYWORDS: Photomasks, Absorbance, Argon ion lasers, Gaussian beams, Transparency, Absorption, Oxides, Glasses, Bismuth, Oxidation

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Proceedings Article | 27 May 2005 Paper

Inter-layer vias and TESH interconnection network for a 3-D heterogeneous sensor system on a chip

Shekhar Bhansali, Glenn Chapman, Vijay Jain

Proceedings Volume 5796, (2005) https://doi.org/10.1117/12.606938

KEYWORDS: Sensors, Silicon, Infrared sensors, Resistance, Etching, System on a chip, Signal processing, Acoustics, Metals, Semiconducting wafers

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Proceedings Article | 4 May 2005 Paper

Enhanced inorganic bimetallic thermal resists transparency and resolution for photomask fabrication

Willy Lennard, Glenn Chapman, James Dykes, Jun Peng, Jun Wang, Karen Kavanagh, David Poon, Chinheng Choo, Yuqiang Tu

Proceedings Volume 5753, (2005) https://doi.org/10.1117/12.600463

KEYWORDS: Photomasks, Glasses, Photoresist materials, Silicon, Aluminum, Absorbance, Transparency, Silicon films, Lithography, Oxidation

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Proceedings Article | 15 April 2005 Paper

Angular domain image detectability with changing turbid medium scattering coefficients

Josna Rao, Paulman Chan, Jozsef Dudas, Nick Pfeiffer, Glenn Chapman

Proceedings Volume 5695, (2005) https://doi.org/10.1117/12.592612

KEYWORDS: Scattering, Light scattering, Laser scattering, Sensors, Photons, Beam expanders, Imaging systems, Collimators, Charge-coupled devices, Image resolution

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Proceedings Article | 15 April 2005 Paper

Monte Carlo simulations of the growth and decay of quasi-ballistic photon fractions with depth in an isotropic scattering medium

Nick Pfeiffer, Glenn Chapman

Proceedings Volume 5695, (2005) https://doi.org/10.1117/12.590512

KEYWORDS: Photon transport, Scattering, Monte Carlo methods, Single photon, Sensors, Tissues, Anisotropy, Absorption, Tissue optics, Light scattering

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Proceedings Article | 12 April 2005 Paper

Creating precise 3D microstructures using laser direct-write bimetallic thermal resist grayscale photomasks

James Dykes, David Poon, Glenn Chapman, Jun Peng, Yuqiang Tu, Chinheng Choo, Jun Wang

Proceedings Volume 5713, (2005) https://doi.org/10.1117/12.601545

KEYWORDS: Photoresist materials, Photomasks, Glasses, Silicon, Photoresist developing, Lithography, Calibration, Raster graphics, Silicon films, Camera shutters

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Proceedings Article | 7 March 2005 Paper

Fault tolerant photodiode and photogate active pixel sensors

Cory Jung, Glenn Chapman, Henry Lin, Yves Audet, Edward Loo, Michelle La Haye, Desmond Cheung, Sunjaya Djaja

Proceedings Volume 5677, (2005) https://doi.org/10.1117/12.588041

KEYWORDS: Transistors, Photodiodes, Sensors, Active sensors, Imaging systems, Optical simulations, Microscopes, Reliability, Optical testing, Device simulation

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Proceedings Article | 9 December 2004 Paper

Laser direct write patterned indium tin oxide films for photomasks and anisotropic resist applications

Jun Peng, Glenn Chapman, Yuqiang Tu

Proceedings Volume 5578, (2004) https://doi.org/10.1117/12.567642

KEYWORDS: Tin, Indium, Photomasks, Oxides, Etching, Silicon, Anisotropic etching, Laser processing, Semiconducting wafers, Oxidation

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Proceedings Article | 6 December 2004 Paper

Calibrating grayscale direct write bimetallic photomasks to create 3D photoresist structures

Jun Peng, David Poon, Glenn Chapman, Yuqiang Tu, Chinheng Choo, James Dykes

Proceedings Volume 5567, (2004) https://doi.org/10.1117/12.569405

KEYWORDS: Photomasks, Photoresist materials, Calibration, Raster graphics, Camera shutters, Absorbance, Tin, Silicon, Transparency, Binary data

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Proceedings Article | 1 September 2004 Paper

3D heterogeneous sensor system on a chip for defense and security applications

Shekhar Bhansali, Dennis Tebbe, Glenn Chapman, Yehea Ismail, Eby Friedman, Vijay Jain, P. Mukund

Proceedings Volume 5417, (2004) https://doi.org/10.1117/12.548199

KEYWORDS: Sensors, Infrared sensors, System on a chip, Infrared imaging, Analog electronics, 3D image processing, Digital signal processing, Silicon, Acoustics, 3D modeling

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Proceedings Article | 15 July 2004 Paper

Creating 3D structures with a direct-write grayscale photomask made from Sn/In bimetallic films

Yuqiang Tu, Glenn Chapman, Jun Peng

Proceedings Volume 5339, (2004) https://doi.org/10.1117/12.529492

KEYWORDS: Photomasks, Indium, Absorption, Argon ion lasers, Tin, Glasses, Absorbance, Photoresist materials, Binary data, Raster graphics

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Proceedings Article | 1 July 2004 Paper

Angular domain imaging of phantom objects within highly scattering mediums

Nick Pfeiffer, Glenn Chapman, Bob Wai

Proceedings Volume 5319, (2004) https://doi.org/10.1117/12.529920

KEYWORDS: Scattering, Light scattering, Laser scattering, Photons, Charge-coupled devices, Sensors, Collimators, Monte Carlo methods, Optical spheres, Tissue optics

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Proceedings Article | 14 June 2004 Paper

Fault-tolerant active pixel sensors for large-area digital imaging systems

Sunjaya Djaja, Glenn Chapman, Cory Jung, Desmond Cheung, Yves Audet, Bob Wai

Proceedings Volume 5356, (2004) https://doi.org/10.1117/12.529923

KEYWORDS: Sensors, Transistors, Active sensors, Photodiodes, Tolerancing, Imaging systems, CMOS sensors, Signal detection, Error analysis, CMOS technology

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Proceedings Article | 14 May 2004 Paper

Inorganic Bi/In thermal resist as a high-etch-ratio patterning layer for CF4/CHF3/O2 plasma etch

Jun Peng, Glenn Chapman, Yuqiang Tu

Proceedings Volume 5376, (2004) https://doi.org/10.1117/12.536193

KEYWORDS: Etching, Plasma etching, Silicon, Plasma, Anisotropic etching, Bismuth, Indium, Wet etching, Optical lithography, Photoresist materials

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Proceedings Article | 30 December 2003 Paper

Bi/In thermal resist for both Si anisotropic wet etching and Si/SiO2 plasma etching

Jun Peng, Yuqiang Tu, Glenn Chapman

Proceedings Volume 5342, (2003) https://doi.org/10.1117/12.524690

KEYWORDS: Etching, Plasma etching, Silicon, Bismuth, Anisotropic etching, Plasma, Wet etching, Indium, Photoresist materials, Semiconducting wafers

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Proceedings Article | 17 December 2003 Paper

Creating direct-write gray-scale photomasks with bimetallic thin film thermal resists

Masahiko Mio, Yuqiang Tu, Jun Peng, James Dykes, Glenn Chapman

Proceedings Volume 5256, (2003) https://doi.org/10.1117/12.518213

KEYWORDS: Photomasks, Bismuth, Absorption, Photoresist materials, Glasses, Argon ion lasers, Raster graphics, Semiconductor lasers, Binary data, Absorbance

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Proceedings Article | 17 October 2003 Paper

Single step direct-write photomask made from bimetallic Bi/In thermal resist

Glenn Chapman, Richard Tu

Proceedings Volume 4977, (2003) https://doi.org/10.1117/12.479415

KEYWORDS: Photomasks, Bismuth, Quartz, Argon ion lasers, Silicon, Glasses, Solar cells, Absorption, Absorbance, Oxides

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Proceedings Article | 29 July 2003 Paper

Angular domain optical imaging of structures within highly scattering material using silicon micromachined collimating arrays

Maria Trinh, Desmond Lee, Nick Pfeiffer, Gary Chu, Glenn Chapman

Proceedings Volume 4955, (2003) https://doi.org/10.1117/12.478214

KEYWORDS: Photons, Scattering, Light scattering, Collimators, Laser scattering, Monte Carlo methods, Sensors, Silicon, Charge-coupled devices, Glasses

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Proceedings Article | 12 June 2003 Paper

Wavelength invariant Bi/In thermal resist as a Si anisotropic etch masking layer and direct-write photomask material

Glenn Chapman, Yuqiang Tu, Jun Peng

Proceedings Volume 5039, (2003) https://doi.org/10.1117/12.485177

KEYWORDS: Photomasks, Silicon, Etching, Anisotropic etching, Bismuth, Absorption, Glasses, Argon ion lasers, Thermal modeling, Quartz

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Proceedings Article | 15 January 2003 Paper

Bi/In as patterning and masking layers for alkaline-based Si anisotropic etching

Yuqiang Tu, Glenn Chapman

Proceedings Volume 4979, (2003) https://doi.org/10.1117/12.472807

KEYWORDS: Etching, Silicon, Anisotropic etching, Bismuth, Photomasks, Copper, Semiconducting wafers, Optical lithography, Photoresist materials, Argon ion lasers

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Proceedings Article | 24 July 2002 Paper

Bi/In bimetallic thermal resists for microfabrication, photomasks, and micromachining applications

Glenn Chapman, Richard Tu, Marinko Sarunic

Proceedings Volume 4690, (2002) https://doi.org/10.1117/12.474201

KEYWORDS: Etching, Silicon, Photomasks, Copper, Photoresist processing, Plating, Absorption, Bismuth, Argon ion lasers, Photoresist materials

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Proceedings Article | 18 June 2002 Paper

Bimetallic thermal activated films for microfabrication, photomasks, and data storage

Glenn Chapman, Richard Tu, Marinko Sarunic

Proceedings Volume 4637, (2002) https://doi.org/10.1117/12.470639

KEYWORDS: Absorption, Copper, Photomasks, Bismuth, Plating, Etching, Nickel, Semiconducting wafers, Photoresist processing, Nd:YAG lasers

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Proceedings Article | 26 March 2002 Paper

Optical imaging of objects within highly scattering media using silicon-micromachined collimating arrays

Maria Trinh, Gary Chu, Moninder Tank, Glenn Chapman

Proceedings Volume 4616, (2002) https://doi.org/10.1117/12.463812

KEYWORDS: Scattering, Light scattering, Laser scattering, Collimators, Silicon, Sensors, Photons, Tissue optics, Charge-coupled devices, Glasses

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Proceedings Article | 24 August 2001 Paper

BiIn: a sensitive bimetallic thermal resist

Glenn Chapman, Richard Tu, Marinko Sarunic, Jagjot Dhaliwal

Proceedings Volume 4345, (2001) https://doi.org/10.1117/12.436888

KEYWORDS: Bismuth, Etching, Photoresist materials, Metals, Argon ion lasers, Indium, Glasses, Pulsed laser operation, Reactive ion etching, Photoresist processing

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Proceedings Article | 29 June 2001 Paper

Prototype laser-activated bimetallic thermal resist for microfabrication

Marinko Sarunic, Glenn Chapman, Richard Tu

Proceedings Volume 4274, (2001) https://doi.org/10.1117/12.432509

KEYWORDS: Lithium, Prototyping, Oxygen, Photovoltaics, Bismuth, Microfabrication, Process modeling, Photoresist processing, Indium, Scanning electron microscopy

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Proceedings Article | 3 June 1998 Paper

Laser applications to IC defect correction

Glenn Chapman

Proceedings Volume 3274, (1998) https://doi.org/10.1117/12.309496

KEYWORDS: Metals, Laser cutting, Semiconducting wafers, Silicon, Transistors, Laser processing, Pulsed laser operation, Switches, Semiconductor lasers, Laser applications

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Proceedings Article | 17 September 1996 Paper

Phase-sensitive techniques applied to a micromachined vacuum sensor

P. Juneja, N. Sawadsky, Glenn Chapman

Proceedings Volume 2882, (1996) https://doi.org/10.1117/12.250713

KEYWORDS: Sensors, Phase measurement, Temperature metrology, Signal detection, Amplifiers, CMOS sensors, Oxides, Resistance, Resistors, Interference (communication)

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Proceedings Article | 8 April 1996 Paper

Laser hole drilling in thick polypropylene sheets for alignment sensors

T. Weeks, Glenn Chapman, D. Bergen, Taranjit Samra

Proceedings Volume 2703, (1996) https://doi.org/10.1117/12.237770

KEYWORDS: Sensors, Laser drilling, Pulsed laser operation, CCD image sensors, Charge-coupled devices, Camera shutters, Argon ion lasers, Carbon, Light sources, Microscopes

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Proceedings Article | 30 June 1995 Paper

Integrated transducer systems

Glenn Chapman, M. Parameswaran, Marek Syrzycki

Proceedings Volume 2634, (1995) https://doi.org/10.1117/12.213135

KEYWORDS: Transducers, Sensors, Signal processing, Silicon, Magnetic sensors, Micromachining, System integration, Semiconducting wafers, Chemical fiber sensors, Optical sensors

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Showing 5 of 94 publications

Conference Committee Involvement (4)

Image Sensors and Imaging Systems 2015

9 February 2015 | San Francisco, California, United States

Image Sensors and Imaging Systems 2014

5 February 2014 | San Francisco, California, United States

Sensors, Cameras, and Systems for Industrial/Scientific Applications XIV

6 February 2013 | Burlingame, California, United States

Sensors, Cameras, and Systems for Industrial/Scientific Applications XIII

25 January 2012 | Burlingame, California, United States

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