Dr. Guoqiang Xing
at Semiconductor Manufacturing International Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 27 January 2005 Paper
Chi-Yuan Hung, Bin Zhang, Jian Zhang, GuoQiang Xing
Proceedings Volume 5645, (2005) https://doi.org/10.1117/12.572686
KEYWORDS: Optical proximity correction, Data modeling, Etching, Semiconducting wafers, Photomasks, Optical lithography, Wafer-level optics, Model-based design, Design for manufacturing, Photoresist processing

Proceedings Article | 27 January 2005 Paper
Chao Jung Chen, Xiang Yang Gao, Yi Shih Lin, Lien Huang Cheng, Chia Chu Kuo, GuoQiang Xing, De-Ling Zhou, Makoto Muramatsu, Masahiko Nakashima
Proceedings Volume 5645, (2005) https://doi.org/10.1117/12.575975
KEYWORDS: Etching, Silica, Plasma etching, Plasma, Optical lithography, Semiconducting wafers, Lithography, Coating, Dielectrics, Scanning electron microscopy

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