Intel’s recent 157nm fluoropolymer photoresist development is described, including the benchmarking of photoresist patterning and the suitability of resists in typical Intel etch processes. The imaging results show that the new ultra-low absorbance resists (absorbance <1/μm) show great promise for meeting the 65nm-node ITRS targets. The materials also show good etch resistance when exposed to SiO2, Si3N4 and SixOyNz dry etch chemistries.
Piezoelectric single crystals of lead magnesium niobate in solid solution with lead titanate have generated great interest in the Navy sonar community because of the potential they offer for enhanced transducer performance. Two material properties, in particular, make the piezoelectric single crystals unique; their high 33-mode coupling factor and their low short circuit Young's modulus. Measurements of the large signal electromechanical and mechanical properties on single crystal samples are presented in this paper. These measurements elucidate the behavior of piezoelectric single crystals, including the effect of bias field on the Young's modulus. The ramifications of the measured material properties on transducer design are also discussed.
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