Dr. James G. Shelnut Profile

Dr. James G. Shelnut

at Rohm and Haas Electronic Materials, LLC

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 11 March 2005 Paper

Progress toward board-level optical interconnect technology

Matthew Moynihan, Bruno Sicard, Tuan Ho, Luke Little, Nick Pugliano, James Shelnut, Hai Bin Zheng, Phil Knudsen, Dan Lundy, Nancy Chiarotto, Curtis Lustig, Craig Allen

Proceedings Volume 5731, (2005) https://doi.org/10.1117/12.594675

KEYWORDS: Waveguides, Silicon, Optical interconnects, Copper, Signal attenuation, Polymers, Optics manufacturing, Reliability, Epoxies, Lithography

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Proceedings Article | 10 June 2004 Paper

Progress toward the development of manufacturable integrated optical data buses

Nick Pugliano, Nancy Chiarroto, John Fisher, Noel Heiks, Tuan Ho, Garo Khanarian, Matthew Moynihan, Nathan Pawlowski, Jim Shelnut, David Sherrer, Bruno Sicard, Hai-Bin Zheng

Proceedings Volume 5358, (2004) https://doi.org/10.1117/12.526879

KEYWORDS: Waveguides, Optics manufacturing, Polymers, Integrated optics, Manufacturing, Plating, Connectors, Silicon, Metals, Data integration

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Proceedings Article | 10 November 2003 Paper

Recent developments in high-(Delta)N waveguides

Garo Khanarian, Yujian You, R. Gore, M. Talley, S. Ibbitson, A. Lamola, M. Gallagher, Bruno Sicard, Matthew Moynihan, James Shelnut

Proceedings Volume 5212, (2003) https://doi.org/10.1117/12.514841

KEYWORDS: Waveguides, Refractive index, Scattering, Cladding, Rayleigh scattering, Light scattering, Particles, Interfaces, Silicon, Semiconducting wafers

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Proceedings Article | 10 November 2003 Paper

Hybrid inorganic-organic aqueous base compatible waveguide materials for optical interconnect applications

Matthew Moynihan, Craig Allen, Tuan Ho, Luke Little, Nathan Pawlowski, Nick Pugliano, James Shelnut, Bruno Sicard, Hai Bin Zheng, Garo Khanarian

Proceedings Volume 5212, (2003) https://doi.org/10.1117/12.508142

KEYWORDS: Waveguides, Silicon, Optical interconnects, Lithography, Planar waveguides, Refractive index, Polymers, Scattering, Thermography, Birefringence

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