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Jeff Earls
at TriLumina Corp
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 24 February 2020 Paper
Performance, manufacturability, and qualification advances of high-power VCSEL arrays at TriLumina Corporation
Thomas Fanning, John Maynard, Christopher Helms, Lei Yang, David Podva, Jeff Earls, Jacob Lopez, Michael Chung, James Foresi, Mial Warren, Gianluca Bacchin
Proceedings Volume 11300, 1130002 (2020) https://doi.org/10.1117/12.2546689
KEYWORDS: 3D-TOF imaging, Vertical cavity surface emitting lasers, Epitaxy, Semiconducting wafers, Manufacturing, Reliability, Standards development, LIDAR, Humidity, Particles
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