Dr. Jerome M. Vaillant
at CEA-LETI
SPIE Involvement:
Author
Area of Expertise:
CMOS image sensor , Optical simulation , Wavefront sensor , Adaptive Optics
Publications (20)

Proceedings Article | 15 March 2023 Presentation + Paper
Proceedings Volume 12432, 1243204 (2023) https://doi.org/10.1117/12.2646194
KEYWORDS: Optical gratings, Silicon, Polarization, Wave propagation, Image processing, Refractive index, Immersion lithography, Data modeling, Semiconducting wafers, CMOS sensors

Proceedings Article | 14 September 2021 Presentation + Paper
Proceedings Volume 11875, 1187505 (2021) https://doi.org/10.1117/12.2597001
KEYWORDS: Sensors, Diffraction, Microlens, Convolution, Image processing, Image acquisition, Ray tracing, Finite-difference time-domain method

Proceedings Article | 26 March 2019 Paper
Pierre Chevalier, Patrick Quéméré, Charlotte Beylier, Sébastien Bérard-Bergery, Nacima Allouti, Marion Paris, Vincent Farys, Jérôme Vaillant
Proceedings Volume 10958, 109581E (2019) https://doi.org/10.1117/12.2514234
KEYWORDS: Photomasks, Chromium, Microlens, 3D modeling, Atomic force microscopy, Grayscale lithography, Lithography, Photoresist processing, Diffraction, Microlens array

Proceedings Article | 24 May 2018 Presentation + Paper
Proceedings Volume 10677, 1067704 (2018) https://doi.org/10.1117/12.2306123
KEYWORDS: Sensors, Signal to noise ratio, Image sensors, Reflectivity, Near infrared, Databases

Proceedings Article | 24 January 2011 Paper
Jérôme Vaillant, Clémence Mornet, Thomas Decroux, Didier Hérault, Isabelle Schanen
Proceedings Volume 7876, 787613 (2011) https://doi.org/10.1117/12.879603
KEYWORDS: Optical filters, Quantum efficiency, Optical lithography, Transistors, Silicon, Sensors, Image resolution, Optical resolution, Image sensors, Metals

Showing 5 of 20 publications
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