Dr. John Hedley Profile

Dr. John Hedley

at Univ of Newcastle upon Tyne

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Author

Publications (5)

Proceedings Article | 24 February 2009 Paper

Integration of a bioMEMS device into a disposable microfluidic cartridge for medical diagnostics

Pedro Ortiz, Neil Keegan, Julia Spoors, John Hedley, Alun Harris, Jim Burdess, Richard Burnett, Thomas Velten, Margit Biehl, Thorsten Knoll, Werner Haberer, Matthew Solomon, Andrew Campitelli, Calum McNeil

Proceedings Volume 7207, 72070D (2009) https://doi.org/10.1117/12.807944

KEYWORDS: Polymers, Microfluidics, Sensors, Packaging, Microelectromechanical systems, Silicon, Biosensors, Semiconducting wafers, Diagnostics, Glasses

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Proceedings Article | 9 February 2009 Paper

Packaging of a silicon-based biochip

Thomas Velten, Margit Biehl, Werner Haberer, Timo Koch, Pedro Ortiz, Neil Keegan, Julia Spoors, John Hedley, Calum McNeil

Proceedings Volume 7206, 720603 (2009) https://doi.org/10.1117/12.813500

KEYWORDS: Silicon, Packaging, Epoxies, Coating, Sensors, Gold, Interfaces, Microfluidics, Digital signal processing, Connectors

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Proceedings Article | 30 December 2008 Paper

A hybrid MEMS-based microfluidic system for cancer diagnosis

Proceedings Volume 7270, 72700I (2008) https://doi.org/10.1117/12.810010

KEYWORDS: Microfluidics, Polymers, Sensors, Microelectromechanical systems, Packaging, Cancer, Silicon, Biosensors, Diagnostics, Epoxies

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Proceedings Article | 17 August 2004 Paper

An optical workstation for characterization and modification of MEMS

John Hedley, Jim Burdess, Alun Harris, Barry Gallacher, Calum McNeil, Peter Cumpson, Stefan Enderling

Proceedings Volume 5458, (2004) https://doi.org/10.1117/12.545596

KEYWORDS: Microelectromechanical systems, Laser ablation, Semiconducting wafers, Profilometers, Wafer-level optics, Objectives, Silicon, Calibration, Gyroscopes, Sensors

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Proceedings Article | 5 April 2001 Paper

Development of a workstation for optical testing and modification of IMEMS on a wafer

John Hedley, Alun Harris, James Burdess, Mark McNie

Proceedings Volume 4408, (2001) https://doi.org/10.1117/12.425356

KEYWORDS: Semiconducting wafers, Laser ablation, Gyroscopes, Profilometers, Electrodes, Optical testing, Wafer-level optics, Vibrometry, Objectives, Measurement devices

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