Julius Chih-Li Chen
at Nanya Technology Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 7 March 2008 Paper
Chih Li Chen, Chun-Cheng Liao, Pin-Jan Chou, Chiang Lin Shih, Steven Shih
Proceedings Volume 6924, 692437 (2008) https://doi.org/10.1117/12.772499
KEYWORDS: Chromium, Photomasks, Optical lithography, Phase shifts, Data modeling, Resolution enhancement technologies, Optical proximity correction, Nanoimprint lithography, Solids, Manufacturing

Proceedings Article | 27 March 2007 Paper
Chui Fu Chiu, Chih Li Chen, Jenn Wei Lee, Wen Bin Wu, Chiang Lin Shih, Feng Yi Chen, Jeng Ping Lin
Proceedings Volume 6520, 65202E (2007) https://doi.org/10.1117/12.711893
KEYWORDS: Line edge roughness, Photomasks, Polarization, Nanoimprint lithography, Resolution enhancement technologies, Electroluminescence, Lithographic illumination, Phase shifts, Transmittance, Optical lithography

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top