Mr. Niko Baersch Profile

Niko Baersch

at Laser Zentrum Hannover eV

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 29 April 2008 Paper

Surprising phase transformation of a-Si:H films under femtosecond laser impact

Vladimir Volodin, Mikhail Efremov, Grigoriy Kachurin, Sergey Kochubei, Alexander Cherkov, M. Deutschmann, N. Baersch

Proceedings Volume 7025, 70250I (2008) https://doi.org/10.1117/12.802366

KEYWORDS: Crystals, Laser crystals, Raman spectroscopy, Femtosecond phenomena, Silicon, Amorphous silicon, Polarization, Raman scattering, Laser ablation, Pulsed laser operation

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Proceedings Article | 1 June 2004 Paper

Ablation of metals and semiconductors with ultrashort pulsed lasers: improving surface qualities of microcuts and grooves

Andreas Ostendorf, Christian Kulik, Thorsten Bauer, Niko Baersch

Proceedings Volume 5340, (2004) https://doi.org/10.1117/12.530692

KEYWORDS: Laser cutting, Laser ablation, Femtosecond phenomena, Silicon, Electrons, Semiconductor lasers, Metals, Semiconducting wafers, Laser systems engineering, Pulsed laser operation

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Proceedings Article | 19 February 2003 Paper

Speed-rate improvement for microcutting of thin silicon with femtosecond laser pulses

Hans Toenshoff, Andreas Ostendorf, Klaus Koerber, Niko Baersch

Proceedings Volume 4830, (2003) https://doi.org/10.1117/12.486543

KEYWORDS: Laser cutting, Silicon, Semiconductor lasers, Femtosecond phenomena, Semiconducting wafers, Absorption, Laser systems engineering, Laser ablation, Electrons, Polarization

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Proceedings Article | 13 September 2002 Paper

Processing of semiconductors with femtosecond lasers

Hans Toenshoff, Andreas Ostendorf, Niko Baersch

Proceedings Volume 4760, (2002) https://doi.org/10.1117/12.482102

KEYWORDS: Laser cutting, Silicon, Semiconductor lasers, Femtosecond phenomena, Absorption, Semiconducting wafers, Laser ablation, Semiconductors, Polarization, Microelectronics

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